Examples of my corporate communications work

1. New Approach to Marketing Communications
Develop cost-effective, non-traditional marcom tactics to support
goals and achieve brand recognition.
Communication Vehicles & Skills:
• Press releases • Email blasts
• External and internal Web • Surveys
• Product trainings & • Print mailers
seminars • Custom Giveaways
• Data sheets • Authored Articles
• Blogs • Press relationships
• eKnowledge • LCD screens
• Logos • Posters
• Illustrations • Tradeshows & events
• Editing • Social Media tools
• Wrtiting • Brochures & catalogues
• Graphic Design
• Powerpoint presentations
• Videos
Andy Porter • Jessica Faulkner • Evan Kuhlman

2. Advertisements & Magazine Covers
BE BLOWN AWAY
DELIVERING THE INDUSTRY’S BEST RF PERFORMANCE AND FASTEST TIME
TO MARKET FOR CURRENT AND NEXT GENERATION DEVICES, TERADYNE'S
ULTRAWAVE™ 12G WIRELESS TEST SOLUTION WILL BLOW YOU AWAY.
Featuring intuitive programming and highly interactive debugging, the
UltraWave 12G saves time with its embedded industry-standard VSA
algorithms and tools, and backgrounded VSA DSP processing.
Scalable to 96 universal ports, the UltraWave 12G has industry-leading
level accuracy, phase noise and settling time.
UltraWave 12G Its measurement performance, ease of use and speed will amaze you.
600 Riverpark Drive
North Reading, MA
978.370.2700
www.teradyne.com
Copy, illustrations, design

3. Illustrations:
Flash
$100
Me
Million
mo
ry T
est
conductor Test
SOC Test
emi
$3 Billion
eS n
dya
r
Te
According to Teradyne and Industry Sources
Teradyne proudly supports the Boston Food Bank
Teradyne Expands Total Available Market
Ultrawideband Frequency Plan
128 sub carriers
528 MHz BW
Band Group 6
Band Group 1 Band Group 2 Band Group 3 Band Group 4 Band Group 5
As a leader in the Automatic Test Equipment industry, we are proud to
test the technology that makes catching the game on your TV, computer
Carrier 1 Carrier 2 Carrier 3
and cell phone possible. 3432 3960 4488 5016 5544 6072 6680 7128 7656 8184 8712 9240 9768 10296
MHz MHz MHz MHz MHz MHz MHz MHz MHz MHz MHz MHz MHz MHz

4. Logos:
1000
th
UltraWave TM System Shipped
5 Generation Wireless Test
th

5. Tradeshows, events, & meetings:

6. Media Relations:
PRESS RELEASE
600 Riverpark Drive, North Reading, MA 01864 | p: 978.370.2700 | www.teradyne.com
More Than 400 Participants Attend Teradyne’s Device Test Seminars in Asia
NORTH READING, Mass. – December 8, 2008 – Teradyne, Inc. (NYSE: TER) announced more than 400 participants from
approximately 110 companies attended Teradyne’s Device Test Seminar series in October and November. The technical
seminars, held in China, Japan, Korea and Taiwan, discussed evolving device technologies and also presented Teradyne’s
industry leading solutions addressing these test challenges.
“The large number of test engineers and test managers who participated from a broad range of companies demonstrates the
importance of the technologies discussed in these seminars,” said Randy Kramer, manager, Teradyne's Factory Applications
Organization. “Teradyne differentiates itself by providing customers with the most advanced test products as well as industry-
leading device test expertise. Customers count on our expertise to implement the best test solutions for their devices.”
Teradyne’s Factory and Field Applications Engineering teams developed and delivered presentations including testing digital TV
devices with an HDMI port, DDR2/DDR3 memory bus interface tests, DigRF bus testing on next-generation mobile phones, and
microwave test measurements and wafer probe testing. The seminars provided test engineers with an understanding of test
strategies that provide improved test quality, faster time-to-market and lowest cost of test.
About Teradyne
Teradyne (NYSE:TER) is a leading supplier of Automatic Test Equipment used to test complex electronics used in the consumer
electronics, automotive, computing, telecommunications, and aerospace and defense industries. In 2007, Teradyne had sales of
$1.1 billion and currently employs about 3,800 people worldwide. For more information, visit www.teradyne.com. Teradyne (R) is
a registered trademark of Teradyne, Inc. in the U.S. and other countries. All product names are trademarks of Teradyne, Inc.
(including its subsidiaries).
###
Editor’s Note: For product photography and other resources, please visit Teradyne’s press room at:
http://www.teradyne.com/pressRoom/index.html

7. Published Articles:
Postscript
DUMMY
MECHANICAL
« Back | Print
Sign-Off
From potential energy to value added by test (Guest commentary)
Dr. Fang Xu, Teradyne -- Test & Measurement World, 9/19/2007 11:23:00 AM PRINT PROOF
Next Generation RFIC & RFSOC
Recently, there have been many discussions in the press about how people have changed their perceptions of being an engineer. More and NEW PDF
more young people are reluctant to consider engineering as their lifetime profession, and it seems unlikely that many among those who are
REVISED PDF
currently studying engineering are willing to become future test engineers. Moreover, how many of our talented test-engineering colleagues
have quit the test profession?
It is unfortunate that interest in engineering in general and test engineering in particular is diminishing, because test itself has become
increasingly challenging and important. In the semiconductor industry, for instance, we predict that the cost of testing an equivalent transistor
will eventually be higher than its manufacturing cost.
Test Challenges
It is my contention that test is at least as important and valuable as any other stage in production. I employ the concept of generalized
potential to demonstrate that using test to screen scrap from a production line to make the final product is not fundamentally different from
extracting silicon from its dioxide in order to make wafers. They all elevate the potential and add value to the product in the same way.
EE This three-part article series written by Ken Harvey from Teradyne focuses on the test cost impact
We have learned in our physics class that if we elevate an object of a mass m from level 0 to a height h using a force of mg, we need to
PG. 2 of next generation consumer wireless semiconductors. Ken is responsible for the RF product
line architecture at Teradyne. His twenty years of RF/microwave experience includes product
engage a certain amount of work:
development and business management roles for R&D, manufacturing, and field maintenance
applications of commercial and military instrumentation through millimeterwave frequencies.
He graduated from the University of Akron with a B.S.E.E. and Santa Clara University with an
where g is the standard gravity (approximately 9.8 m/s2 at the earth's surface). M.B.A. Ken holds two patents in the microwave instrumentation and precision sensor technology.
If that object falls to level 0, it can produce work of equivalent energy value. So we say that when this object of a mass m is at height h from
level 0, its potential energy is: The first article looks at the structural differences between device generations to suggest the
likely impact by using existing RF ATE. The second article examines key performance aspects
CIRCLE/RS# of future device generations to assess where instrumentation improvements are most likely to
LIT# occur. The third article synthesizes the combined needs and proposes a cost structure and sys-
Then we learned that the weight of that object is due to universal attraction between the object and the earth. Surprisingly, the reference to
define the zero of mutual potential energy of that object and the earth is when their distance is infinite. Therefore, the potential energy of that tem-level requirements based on established multisite economic principles.
SHOWLINE
object at a distance r from the center of gravity of earth is:
I/O CHECK Contact:
PROD MGR Ken Harvey, Teradyne, MS 600-2, 600 Riverpark Drive, North Reading, MA 01864, Telephone:
978-370-3670, e-mail: ken.harvey@teradyne.com
where M is the mass of the earth; G is the gravitational constant, 6.6742 x 10-11m3s-2kg-1.
Indeed, this means any object on earth, including us humans, has a negative potential energy according to the definition in physics!
The more lessons learned, the more this statement rings true: almost every formula to calculate potential energy in physics starts with a
negative sign; electrons around the nuclei; atoms in a crystal; planets around the sun; solar systems in the universe! As electronic engineers,
we are all familiar with the electrostatic potential energy: Nelson Publishing
2500 Tamiami Tr N
Nokomis, FL 34275
1-800-226-6113
Home Buyers Guides EE Online Magazine
Article Archives Product Briefing Editorial Calendar
For Advertisers Nelson Publishing Write for EE
Industry News Subscribe / Renew Contact EE
EE October 2007 Feature Article
Next-Generation RF
Devices Impact Test
by Ken Harvey, Teradyne
The past decade’s build-up of RF ATE for second-generation (2G)
cellular transceivers now is testing more than two billion RF devices
annually (Figure 1). Next-generation consumer wireless devices are © EYEWIRE
much more complex due to additional RF pin-count, new standards
support, and increased digital pin-counts for RF system on a chip
(RFSOC) and RF system in a package (RFSIP) designs.
Replacing real values with complex
can lead to new ideas
Fang Xu
Figure 1. Growth in consumer wireless devices
The test requirements also are changing to include added modulation
N
tests and DSP requirements, concurrent test capability, and more ow that we are adults, we may not remember exactly how we learned to count but it
multisite testing. Both sets of trends impact costs. probably involved associating numbers with real objects. If we have children and are
teaching them to count, we ask them questions like “How many people are there in this
New standards for wireless communications are expanding mobile picture?” During school days, children learn about decimals, fractions, and eventually
handset capability at a seemingly relentless pace. Just as relentless is the complex numbers before going to college. When the concept of complex numbers was first intro-
pace of competitive cost pressure. duced, it served the purpose of accommodating the square root of negative numbers. Rarely has any-
one realized the full usefulness of complex numbers; it goes far beyond the initial application.
The next generation of wireless semiconductors appears to threaten In instrumentation and measurement, when we measure a voltage, a current, a power, or when
cost-reduction objectives. New RF standards tend to require either new we measure acceleration, force, pressure, or temperature, traditionally we dealt only with real num-
transmission frequencies or new noninterference capabilities with bers. We used complex numbers only once in a while; for instance, to calculate the impedance of an
respect to existing RF signals. But, new RF products maintain RC circuit. Despite the fact that complex numbers were obtained in more sophisticated measure-
compatibility with previous standards: Backward compatibility with the ments when Fourier’s analysis was performed, phase information was usually considered as a side
installed network enhances the value of both the wireless network and product and ignored in most applications.
February 2007 IEEE Instrumentation & Measurement Magazine 29
1094-6969/07/$25.00©2007IEEE
Editing, manage publication schedule,
pitch to publications, graphics

8. External Web:
Banners, copy, design, editing, images

9. PowerPoint Presentations:

10. Posters:
BECAUSE TESTING MATTERS
B ECAU S E T E ST I N G M AT T E R S
The electronics industry
challenges Teradyne
D Ex employees to develop
creative approaches to
testing the next big
thing...before it is born.
Introducing, Teradyne’s
Next Generation LCD Here, work is innovative,
Driver Test System cross-functional, and
— The D750Ex fast-paced with a vision.
B E C A U S E T E S T I N G M AT T E R S Gain hands-on experience
with today’s most complex
technologies.
Visit us in our Meeting Suite
Second Floor, West Hall
Booth 8010
www.teradyne.com/careers

11. Tradeshows, events, & meetings:

12. Email blasts:
Teradyne Introduces the UltraWave
Teradyne’s UltraWave 12G Named Finalist
12G Wireless Test Solution
The New D750Ex Test System is designed for testing high- in Test and Measurement World’s
definition LCD driver devices. It is based on the highly Best in Test Awards Building on four generations of Teradyne wireless test solutions
successful J750 platform, which is approaching 2700 systems and over 30 years of RF test experience, Teradyne introduces the
installed worldwide. Test & Measurement World editors have selected UltraWave™ wireless test instrument.
the UltraWave 12G test instrument as a finalist
for the 2009 Best in Test awards. The winner in
The D750Ex system provides a true high density resource per each category will be chosen by a vote of readers UltraWave offers customers 12 GHz source and measurement
pin architecture that supports over 97 percent parallel test and editorial staff. Voting deadline is February 6. performance, with greater parallel test efficiency to ultimately
efficiency of the overall program. It also features both an lower the cost of test. Combined with the UltraFLEX™ test
platform, UltraWave covers the entire spectrum of current and
embedded DSP and central DSP architecture to improve VOTE FOR TERADYNE TODAY emerging connectivity and cellular technologies, including wireless
processing throughput. And its zero footprint design takes up http://www.tmworld.com/article/CA6619985.html LAN, Bluetooth, 3G cellular, and new emerging standards like 4G
50-85 percent less floor space than competitive systems. cellular and ultrawideband.
Teradyne’s wireless device test solutions, including the UltraWave 12G instrument,
For more information on D750Ex, click here. cover the entire spectrum of current and emerging connectivity and cellular For more information, click here.
technologies, including wireless LAN, Bluetooth®, 3G cellular, 4G cellular, WiMAX™
Teradyne is the top story today on the Semiconductor To read the announcement press release, click here.
and ultrawideband.
To read the full press release, click here.
International web site. See what Rod Stewart, Teradyne’s Teradyne is a leading
worldwide supplier of
For more information on the UltraWave 12G, visit
http://www.teradyne.com/flex/UltraWave.html.
general manager of System-On-a-Chip (SOC) test, and Mark automatic test
equipment for logic, RF, © 2008 Teradyne, Inc. All rights reserved.
Kohalmy, Teradyne’s marketing manager for semiconductor
analog, power, mixed-
signal, and memory © 2009 Teradyne, Inc. All rights reserved.
© 2008 Teradyne, Inc. All rights reserved. technologies.
test, had to say about the ATE market. Click here to read the
article.
AUTOTESTCON 2007
YOUR INVITATION TO JOIN US AT AUTOTESTCON 2007
Teradyne is a Join us at Autotestcon 2007 in Baltiimore, Maryland from
You're invited to see the next generation of test
leading worldwide September 17 - 20 at the Renaissance Hotel and Baltimore
Convention Center. Bring a copy of this e-mail to our booth
Teradyne invites you to see the next generation of commercial #445 for a free gift!
supplier of
Join us for a brief
avionics test, featuring: Spectrum CTS
presentation followed Teradyne Celebration:
automatic test 787 support stretegy by a reception in the
second floor Regency
Be our guest for a special celebration of tradition and technology.
Date: Tuesday, following dinner, September 18 from 8:00 PM to 11: PM
Teradyne's Spectrum CTS
equipment for logic, (Common Test System) and
Room on Monday,
March 30 from 5-7
Location: Renaissance Hotel, Baltimore Harbor, Maryland Ballroom
Why: Prizes and gifts to fortunate winners.
240 OEM-certified test p.m. Complimentary
RF, analog, power, programs beer, wine and hors
d’oeuvres will be served.
New Product Demonstrations:
Teradyne will demonstrate its Core System Instrumentation (CSi) products, including the Di-Series
mixed-signal, and New at 2009 AMC: Teradyne, Boeing and other key 787 of high-performance digital test instruments and the Ai-760 high-density analog test instrument.
Also on display will be our Spectrum 9100 Test System. Please visit our booth for more detailed
suppliers have agreed on a support strategy. Visit Teradyne at Suite
memory 2421 each evening
during the conference to
information and technical demonstrations.
technologies. Spectrum CTS replaces the ATS-182a for testing Boeing 737,
747, 757, 767 avionics and features new capability for 737NG,
learn more about
Spectrum CTS, and for
Daily Raffle Prizes
Tuesday at 2:00 PM
your chance to win a Wednesday at 11:30 AM and 3:00 PM
777 and now the 787 airplanes.
Nintendo Wii Fit Game Thursday at 11:30 AM
Package, Garmin GPS Drop your business card at either registration desk to enter!
© 2008 Teradyne, Inc. All rights reserved. Suite Hours: and other great prizes.
IEEE Paper Presentations
Monday: 7:00 p.m. - 12:00 a.m.
Tuesday: 6:00 p.m. - 12:00 a.m.
Wednesday: 5:00 p.m. - 12:00 a.m "Digital Test Program Re-hosting Considerations and Applications" by Eric
Truebenbach.
Tuesday, Sept 18, 3:15 PM - 5:00 PM, Track D.1
We look forward to seeing you at 2009 AMC! This paper examines simultaneously upgrading digital test instruments and maintaining
compatibility with older programs. Specific features are included in a new instrument to
minimize or eliminate conversion effort.
For more information, call (978) 370-6528
email attila.shevket@teradyne.com "ATML Capabilities Explained" by Teresa Lopes.
Wednesday, Sept 19, 8:00 AM - 9:45 PM, Track C.2
or visit www.teradyne.com/AMC
This paper describes the major concepts of ATML Capabilities and how they are used to
describe instrument performance and capabilities, using simple examples and use casesr.
© 2009 Teradyne, Inc. All rights reserved.
"Benefits of LRU-centric Fibre Channel Testing" by Yonet Eracar
Thursday, Sept 20, 10:00 AM - 11:45 AM, Track D.7
This paper provides a brief overview of the Fibre Channel technology, the Military/Avionics
applications, and test requirements. The Paper specifies an LRU-centric Fibre Channel testing
framework and provides implementation guidelines using example applications.
"Managing Testability" Panel co-hosted by Dean Matsuura
Wednesday, Sept 19, 10:00 AM - 11:45 AM, Track D.3., Track C.2
Moderator is Louis Ungar of A.T.E. Solutions, Inc..
Copy, design, management of lists, Web integration