The PinPoint system provides benchtop diagnostic testing of printed circuit boards. It offers fixtureless testing through multiple strategies like in-circuit, impedance signatures, and reverse engineering. PinPoint can rapidly diagnose faults down to the component level. It features various test methods like in-circuit, analog functional, and analog signature analysis. PinPoint integrates with functional test systems and has typical fault coverage including opens, shorts, voltage, and functional failures. It provides automated diagnostic programming to reduce time to identify issues.
3. PinPoint
Leading PCB Benchtop Diagnostic solution
Fixtureless testing
Multiple test Strategies:
In-Circuit
Impedance Signatures
Reverse Engineering
Full Analog and Digital
Provides rapid diagnostics to Component Level
4. Test Methods
In-Circuit & Card-Edge Tests Trace Tests between components
Dynamic Digital Functional
Automatic Program Generation
Analog Functional
IC Identifier for unknowns
Analog Signature Analysis
In-Circuit/Out of Circuit tests
Hybrid Functional
Reverse Engineering Boundary Scan Integration
Schematic Generation PXI integration
7. Where PinPoint Fits
Two-Tiered Test Approach
LRU’s
SRU’s
EADS/Aerospatiale
ATEC Any Functional
Test Set
Air Force Navy Bombardier
8. Test Result Server &
ATML Interfaces
• Interfacing between any
functional test system and
PinPoint
• Uses open interface software
• ATML standard interface to
extract indictment lists and write
diagnostic results
9. US Air Force AWACS
Saving Programming Time
Typical TPS programming time.
GO/NOGO DIAGNOSTICS
12 Weeks 36 Weeks
Diagnostics programming with the PinPoint
GO/NOGO DIAGNOSTICS
12 Weeks 2 weeks
10. Automatic Fixtureless Test Methods
Providing Test, Consistency and Result Data
Analog Functional Dynamic Digital
Network Signatures Boundary Scan
TMS
TCK
TDI TDO
11. Device Test Interface
• Robust custom Interfaces
• Fatigue Life of over 1,000,000 cycles
• Ergonomic Handles for Even Weight Dist.
• Repairable should a pin fail
• Down to 0.4mm pin-pitch
12. DTI Package Range
SSOP TSOP TSSOP
TSOP1 QVSOP QFP
PQFP TQFP PGA
DIP ZIP PLCC
17. In-Built Instrumentation
Interactive or Automatic Use with a Test Program
Functional Analogue
DMM
Dual Timer Counter
Arbitrary Waveform Generators, 4 Max per Card
Oscilloscope, 100MHz dual channel
16 Single Ended / 8 Differential Analogue Inputs
Avionics Reference Output, 400Hz 26V
Analogue Signature Analyser
Fully Programmable
Current Limit Protection
18. In-Built Instrumentation
4 ½ Digit Digital Multi Meter
100Mhz Dual Channel Oscilloscope
Dual Channel Frequency / Timer Counter
Arbitrary Waveform Generator 4 max per card
16 Single Ended / 8 Differential Analog Inputs
19. Vectorless Test – V / I signatures
• Fully programmable Frequency Range 5Hz to 3Khz
(1 Hz Res)
• 256 Voltage / Current ranges
• Multiple Waveform types (Sine Square Triangle,
etc)
• Pulse Generator for Gate-Fired devices
• Current limit protection
20. Vectorless Test – Shorts Locator
• Interactive tool to determine the exact point
at which a short circuit has occurred
• Intuitive User Interface
• Audible and graphical display to guide the
user
• Specification summary:
– 500mV max o/c voltage
– 1A max s/c current
– 3 sense ranges (x1, x10, x100)
– User selectable audio frequency output
21. Vectorless Test – LCR Bridge
• Used to measure the values of Inductors,
Capacitors and Resistors
• Measures secondary characteristics
– D factor (Dissipation factor – capacitors)
– Q (characterises a resonators bandwidth)
– ESR (Equivalent Series Resistance)
• Series / Parallel equivalent circuits
• Kelvin measurement system
• Multiplexed to intenal rows A and D
Specification summary:
• Inductance 1uH to 1000H
• Capacitance 1pF to 1F
• Resistance 10mΩ to 100MΩ
22. Vectorless Test – PTU
Parametric Test Unit
• Four independent channels dedicated to precision DC voltage and current sources
• Provide functional testing of discrete components in and out of circuit:
• Programmable voltage and current on each channel
• Each channel can sink or source current or voltage
• Semiconductor junction forward voltage
• Output drive levels of devices or circuits
• Tri-state leakage current
• hFE of transistors
Specification summary
• + / - 10V
• + / - 20mA
• 2.5mV resolution
• 5uA resolution
23. Analog Programming
Graphical Instrument Strategizer
Providing the ability to rapidly use
any external instrument that has a
VISATM software driver
Eliminates the need to create
instrument specific software
drivers
Automatic self-configuring of the
software
Simple insertion of the VISATM
Driver into a directory
24. Analog Programming
‘C’ Function Editor
‘C’ Function Editor
Providing the power of the ‘C’ programming language
Easily included in the standard TestFlow structure using the drag-and-drop icon provided
25. Boundary Scan
TMS
TCK
TDI TDO
Leading Boundary Scan System
JTAG Compliant System
Quick & easy to Use
Tests BGA Components
Tests complete boards
Provides device status
Pin Points Faults
26. Data Capture Pod
Capture
Input
Data Pass stimulus data to
PPII
Reset
or
Sync
Inputs driven
Program Generated
Outputs collected
27. Bed of Nails Option
Provides:
Interface for fixtures (VP G12)
Housing for multiplexer cards
Automatic testing of devices
Includes:
Bed of Nails Software
29. Diagnostic Sub-System
19” rack Diagnostic sub-
system
10U
Integration with third-party functional test sets to
provide excellent and proven PCB component level
diagnostic capability
Rugged versions for deployable applications
Scaleable diagnostic capabilities through an industry
standard 19” rack mounting
Runs under the proven TestVUETM suite
30. PinPoint UDA
PCB Diagnostics
Module Test To component and network
Digital level
Analog Guided Probe
Mixed Signal Dynamic functional
Analog Signatures
Component Functionality
Values of Passive devices