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Device Modeling Report



COMPONENTS: Silicon Carbide Schottky Diode
PART NUMBER: SCS110AG
MANUFACTURER: ROHM
REMARK: Standard Model
REPORT:(LTspice IV)




                Bee Technologies Inc.



  All Rights Reserved Copyright (C) Bee Technologies Inc. 2010
Spice model
                                     Model description
 parameter
     IS        Saturation Current
     N         Emission Coefficient
     RS        Series Resistance
    IKF        High-injection Knee Current
    CJO        Zero-bias Junction Capacitance
     M         Junction Grading Coefficient
     VJ        Junction Potential
    ISR        Recombination Current Saturation Value
     BV        Reverse Breakdown Voltage(a positive value)
    IBV        Reverse Breakdown Current(a positive value)
     TT        Transit Time
    EG         Energy-band Gap




              All Rights Reserved Copyright (C) Bee Technologies Inc. 2010
Forward Current Characteristic

Circuit Simulation Result




Evaluation Circuit




                     All Rights Reserved Copyright (C) Bee Technologies Inc. 2010
Comparison Graph

Circuit Simulation Result

                               100.000
                                                   Measurement
                                                   Simulation

                                10.000
      FORWARD CURRENT: IF(A)




                                 1.000



                                 0.100



                                 0.010



                                 0.001
                                         0.0           0.5            1.0         1.5           2.0            2.5
                                                                FORWARD VOLTAGE: VF(V)


Simulation Result

                                                                       VF(V)
                                    IF(A)                                                          Error (%)
                                                     Measurement               Simulation
                                          0.001             0.8800                    0.8860               0.68
                                           0.01             0.9400                    0.9459               0.63
                                             0.1            1.0100                    1.0091              -0.09
                                             0.2            1.0350                    1.0311              -0.38
                                             0.5            1.0700                    1.0669              -0.29
                                               1            1.1070                    1.1050              -0.18
                                               2            1.1700                    1.1628              -0.62
                                               5            1.3000                    1.3030               0.23
                                             10             1.5000                    1.5062               0.41
                                             15             1.7000                    1.6964              -0.21




                                           All Rights Reserved Copyright (C) Bee Technologies Inc. 2010
Junction Capacitance Characteristic

Circuit Simulation Result




Evaluation Circuit




                     All Rights Reserved Copyright (C) Bee Technologies Inc. 2010
Comparison Graph

Circuit Simulation Result


                                              1000
                                                                                                            Measurement
       CAPACITANCE BETWEEN TERMINAL: Ct(pF)




                                                                                                            Simulation




                                              100




                                                10




                                                1
                                                     0.1                   1                 10                           100
                                                                          REVERSE VOLTAGE:VR(V)


Simulation Result

                                                                                C (pF)
                                                VR(V)                                                          Error (%)
                                                                  Measurement             Simulation
                                                            0.1         530.012                 533.839                0.72
                                                            0.2         507.843                 517.441                1.89
                                                            0.5         458.372                 463.662                1.15
                                                              1         400.824                 403.313                0.62
                                                              2         331.687                 331.478               -0.06
                                                              5         234.876                 237.073                0.94
                                                            10          176.213                 177.055                0.48
                                                            20          129.285                 129.551                0.21
                                                            50           84.692                  84.318               -0.44
                                                           100           62.109                  60.590               -2.45




                                                       All Rights Reserved Copyright (C) Bee Technologies Inc. 2010
Reverse Recovery Characteristic

Circuit Simulation Result




                                                Time (s)

Evaluation Circuit




Compare Measurement vs. Simulation

                               Measurement                 Simulation          Error (%)
            trj        ns                   7.500                  7.509             0.11




                     All Rights Reserved Copyright (C) Bee Technologies Inc. 2010
Reverse Recovery Characteristic                                                 Reference




                                                      Measurement




Trj =7.5(ns)
Trb=16.0(ns)
Conditions: Ifwd=0.2A, Irev=0.2A, Rl=50Ω




                                                          Example




                               Relation between trj and trb




                 All Rights Reserved Copyright (C) Bee Technologies Inc. 2010

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SPICE MODEL of SCS110AG , TC=25degree , LTspice (Standard Model) in SPICE PARK

  • 1. Device Modeling Report COMPONENTS: Silicon Carbide Schottky Diode PART NUMBER: SCS110AG MANUFACTURER: ROHM REMARK: Standard Model REPORT:(LTspice IV) Bee Technologies Inc. All Rights Reserved Copyright (C) Bee Technologies Inc. 2010
  • 2. Spice model Model description parameter IS Saturation Current N Emission Coefficient RS Series Resistance IKF High-injection Knee Current CJO Zero-bias Junction Capacitance M Junction Grading Coefficient VJ Junction Potential ISR Recombination Current Saturation Value BV Reverse Breakdown Voltage(a positive value) IBV Reverse Breakdown Current(a positive value) TT Transit Time EG Energy-band Gap All Rights Reserved Copyright (C) Bee Technologies Inc. 2010
  • 3. Forward Current Characteristic Circuit Simulation Result Evaluation Circuit All Rights Reserved Copyright (C) Bee Technologies Inc. 2010
  • 4. Comparison Graph Circuit Simulation Result 100.000 Measurement Simulation 10.000 FORWARD CURRENT: IF(A) 1.000 0.100 0.010 0.001 0.0 0.5 1.0 1.5 2.0 2.5 FORWARD VOLTAGE: VF(V) Simulation Result VF(V) IF(A) Error (%) Measurement Simulation 0.001 0.8800 0.8860 0.68 0.01 0.9400 0.9459 0.63 0.1 1.0100 1.0091 -0.09 0.2 1.0350 1.0311 -0.38 0.5 1.0700 1.0669 -0.29 1 1.1070 1.1050 -0.18 2 1.1700 1.1628 -0.62 5 1.3000 1.3030 0.23 10 1.5000 1.5062 0.41 15 1.7000 1.6964 -0.21 All Rights Reserved Copyright (C) Bee Technologies Inc. 2010
  • 5. Junction Capacitance Characteristic Circuit Simulation Result Evaluation Circuit All Rights Reserved Copyright (C) Bee Technologies Inc. 2010
  • 6. Comparison Graph Circuit Simulation Result 1000 Measurement CAPACITANCE BETWEEN TERMINAL: Ct(pF) Simulation 100 10 1 0.1 1 10 100 REVERSE VOLTAGE:VR(V) Simulation Result C (pF) VR(V) Error (%) Measurement Simulation 0.1 530.012 533.839 0.72 0.2 507.843 517.441 1.89 0.5 458.372 463.662 1.15 1 400.824 403.313 0.62 2 331.687 331.478 -0.06 5 234.876 237.073 0.94 10 176.213 177.055 0.48 20 129.285 129.551 0.21 50 84.692 84.318 -0.44 100 62.109 60.590 -2.45 All Rights Reserved Copyright (C) Bee Technologies Inc. 2010
  • 7. Reverse Recovery Characteristic Circuit Simulation Result Time (s) Evaluation Circuit Compare Measurement vs. Simulation Measurement Simulation Error (%) trj ns 7.500 7.509 0.11 All Rights Reserved Copyright (C) Bee Technologies Inc. 2010
  • 8. Reverse Recovery Characteristic Reference Measurement Trj =7.5(ns) Trb=16.0(ns) Conditions: Ifwd=0.2A, Irev=0.2A, Rl=50Ω Example Relation between trj and trb All Rights Reserved Copyright (C) Bee Technologies Inc. 2010