This document discusses applying agile testing methods to complex embedded systems. It describes a distributed Ethernet optical switch system with over 500,000 lines of code across 6 architectural subsystems. The challenges of testing such a complex system in short time intervals are discussed. The approach taken involved using integration spikes to prove high risk interfaces early. Extensive automation was employed, with 60% of the integration team focused on automation. Over 1000 automated tests were run nightly against the main code branch. A virtual test environment was also utilized to improve testing efficiency.