Slides from my SPLASH 2010 presentation: Kalle Aaltonen, Petri Ihantola, Otto Seppälä (2010). Mutation analysis vs. code coverage in automated assessment of students’ testing skills. In: SPLASH ’10: Proceedings of the ACM international conference companion on Object oriented programming systems languages and applications companion. Reno/Tahoe, Nevada, USA: ACM, pp. 153–160. ISBN: 978-1-4503-0240-1. http://dx.doi.org/10.1145/1869542.1869567