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Isaac E. Chao  B.S. Materials Science and Engineering [email_address]
Outline ,[object Object],[object Object],[object Object],[object Object],[object Object],[object Object],[object Object],[object Object]
Education ,[object Object],[object Object],[object Object],[object Object],[object Object],[object Object],[object Object],[object Object],[object Object]
Education: Rutgers  ,[object Object],[object Object],[object Object]
Skills: Processing ,[object Object],[object Object]
Skills: Processing ,[object Object],[object Object],[object Object],[object Object]
Skills ,[object Object],[object Object],[object Object]
Skills: Characterization ,[object Object],[object Object],[object Object],[object Object],[object Object],[object Object]
Skills: Design ,[object Object],[object Object],[object Object]
Relevant Course Work ,[object Object],[object Object],[object Object],[object Object],[object Object],[object Object]
Skills: Non-technical ,[object Object],[object Object],[object Object],[object Object],[object Object],[object Object]
Work Experience: Outline ,[object Object],[object Object],[object Object],[object Object],[object Object],[object Object],[object Object],[object Object],[object Object]
Rutgers University Materials Science and Engineering: Undergraduate Research ,[object Object],[object Object],[object Object],[object Object],[object Object]
Senior Project Overview: Terahertz Technology ,[object Object],http://departments.colgate.edu/physics/research/condensedm/conden1.jpg
Why Terahertz? ,[object Object],[object Object],[object Object],http://www.jhuapl.edu/programs/rtdc/SensorTechnology/TerahertzImaging.html
Direction of Project ,[object Object],[object Object],[object Object]
Silver Deposition Setup reducing solution pump clamp pipette tip pipette tip waveguide Tygon tubing silvering solution waste
Polymer Deposition Method ,[object Object],[object Object],[object Object]
Changes in direction ,[object Object],[object Object],[object Object]
Lower wt% vs. high Property Lower wt% Higher wt% Adhesion √ Smoothness/ Uniformity √ Transmittance √ Thickness √
Absorption Spectrum for PS coated sample (2 wt%) Polystyrene absorption peak 6th 5th 4th 3 rd  order interference peak
What this means ,[object Object]
Film thickness Film Thickness can be determined from Absorption Data: Lambda: primary absorption wavelength  n: refractive index of material n= 1.57 for polystyrene The thickness of our film was determined to be  1.53 micrometers
Problems to be addressed ,[object Object],[object Object],[object Object]
Goals ,[object Object],[object Object]
OFS Optics: Laboratory Technician ,[object Object],[object Object],[object Object],[object Object]
LAMSS: University of South Carolina ,[object Object]
LabVIEW ,[object Object]
The Virtual Instrument ,[object Object]
Characterization of PZT thin films ,[object Object],[object Object]
Sample Preparation ,[object Object]
PZT Sensor Sample Diagram
Optical Microscopy of Sample The optical microscopy images produced no blemishes of  significance.  The ones seen on this slide are attributed to dust on the sample (and/or lens).
Scanning Electron Microscopy (SEM) The SEM produced an image which shows small blemishes on the surface of the PZT thin-film.  These could be attributed to damage to the PZT during handling, but could possibly represent imperfections on the sputtered surface on a scale of 10^(-6) meters.
X-Ray Diffraction (XRD) ,[object Object]
Atomic Force Microscopy of the Sample
Atomic Force Microscopy of the Sample AFM shows that surface deflection remains at the nano scale (10^-9), which is insignificant compared to the thickness of the layer (10^-6).
Conclusion of LAMSS work ,[object Object]
Overview:  Isaac E. Chao ,[object Object],[object Object],[object Object],[object Object],[object Object]

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Engineering Skills

  • 1. Isaac E. Chao B.S. Materials Science and Engineering [email_address]
  • 2.
  • 3.
  • 4.
  • 5.
  • 6.
  • 7.
  • 8.
  • 9.
  • 10.
  • 11.
  • 12.
  • 13.
  • 14.
  • 15.
  • 16.
  • 17. Silver Deposition Setup reducing solution pump clamp pipette tip pipette tip waveguide Tygon tubing silvering solution waste
  • 18.
  • 19.
  • 20. Lower wt% vs. high Property Lower wt% Higher wt% Adhesion √ Smoothness/ Uniformity √ Transmittance √ Thickness √
  • 21. Absorption Spectrum for PS coated sample (2 wt%) Polystyrene absorption peak 6th 5th 4th 3 rd order interference peak
  • 22.
  • 23. Film thickness Film Thickness can be determined from Absorption Data: Lambda: primary absorption wavelength n: refractive index of material n= 1.57 for polystyrene The thickness of our film was determined to be 1.53 micrometers
  • 24.
  • 25.
  • 26.
  • 27.
  • 28.
  • 29.
  • 30.
  • 31.
  • 32. PZT Sensor Sample Diagram
  • 33. Optical Microscopy of Sample The optical microscopy images produced no blemishes of significance. The ones seen on this slide are attributed to dust on the sample (and/or lens).
  • 34. Scanning Electron Microscopy (SEM) The SEM produced an image which shows small blemishes on the surface of the PZT thin-film. These could be attributed to damage to the PZT during handling, but could possibly represent imperfections on the sputtered surface on a scale of 10^(-6) meters.
  • 35.
  • 36. Atomic Force Microscopy of the Sample
  • 37. Atomic Force Microscopy of the Sample AFM shows that surface deflection remains at the nano scale (10^-9), which is insignificant compared to the thickness of the layer (10^-6).
  • 38.
  • 39.