1.
Contact us for more details!
Authorized Distributor：
www.gaiascience.com.sg
enquiry@gaiascience.com.sg
+65 6897 2772
Block 102 E Pasir Panjang Road
#02-07 Singapore 118529
Gaia Science Pte Ltd
The first dual-camera
system ever adopted in
research AFM
Machine learning automation
with updatable data
AI Robotics Technology
With the simple click of a
button, Park FX40
automatically changes and
replaces its own tips
A New Class of Atomic
Force Microscope (AFM)
Park FX40
One Nanostep for Microscopy
One Giant Leap for Science​
Auto Probe Exchange: Replace old
probes easily and safely in full
automation.
Auto Probe Reading: The Probe
Identification Camera reads the QR
code imprinted on the chip carrier of a
newly loaded probe enables you to
select the best probe tip for each job.
Auto Beam Alignment: It shifts the X,
Y and Z axis for clearer images, with no
distortion, at the click of a button.
Automatic Probe Pairing to
Sample Locations
Sample Camera with storage capacity
for up to four different samples
simultaneously on the chuck, the
sample camera effortlessly locates the
most relevant spot for scanning