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9 carrier aggregation lte-a new challenges for lab and field
1. I International Workshop on Challenges and Trends Beyond LTE-A
Presentation:
Carrier Aggregation: LTE-A New
Challenges for Lab and Field
Speaker: Adryele Neves
Title: Account Manager of Anritsu Brazil
(focus on Wireless UEs Manufacturers and R&D
Laboratories in Brazil)
Date: November 6th, 2013
2. I International Workshop on Challenges and Trends Beyond LTE-A
Table of Contents
•
•
•
•
Anritsu – Global Company
Market trend/ Technology
Background
Anritsu Conformance Wireless
Portfolio
•
•
•
•
MT8820C
MD8430/MD8480
MD8475A
Conformance Test System
Challenges in the Lab
•
•
Powerful Hardware
Further Applications
•
•
•
•
•
•
Server, IMS/VoLTE
IPv6 / Wi-fi Applications
Audio Quality
Batery Test
Challenges in the Field
• Anritsu Handhelds Portfolio
• Precision vs. Handheld
• New Challenges
Anritsu e-Learning (Free)
3. I International Workshop on Challenges and Trends Beyond LTE-A
Anritsu Global Company
Development & manufacturing
Sales Office
Engineering
& Services
Europe
Japan
North & South America
Asia & Pacific
• Europe : 5 Subsidiaries
• Asia & Pacific : 5 Subsidiaries
• North & South America : 4 Subsidiaries
2005.05.10 MXR
4. I International Workshop on Challenges and Trends Beyond LTE-A
Anritsu’s Global Network
Holding Company
Anritsu U.S. Holding Inc.
Sales Companies
Anritsu Company (U.S.A.)
Anritsu Electronics Ltd. (Canada)
ˆ
Anritsu Eletronica Ltda. (Brazil)
Manufacturing & Development
Companies
Anritsu Company (U.S.A.)
Anritsu Limited (U.K.)
Anritsu Ltd. (U.K.)
Anritsu S.A. (France)
Anritsu GmbH (Germany)
Anritsu S.p.A. (Italy)
Anritsu AB (Sweden / Finland / Denmark)
Anritsu Company Ltd. (Hong Kong)
Engineering & Services Company
Anritsu Electronics (Shanghai) Co., Ltd.
(P.R.China)
Anritsu Company, Inc. (Taiwan)
Anritsu Corporation,Ltd. (Korea)
Anritsu Private Ltd. (Singapore)
Anritsu Proprietary Ltd. (Australia)
2005.05.10 MXR
5. I International Workshop on Challenges and Trends Beyond LTE-A
Market Trend/
Important Technology Background
6. I International Workshop on Challenges and Trends Beyond LTE-A
Market Trend – Smartphone user device
• # of LTE Smartphone devices
lineup are fivefold increase
during a year.
• Smartphone is No.1 share in
the LTE user device as of
Mar. 2013.
Jan. 2012
Source: GSA
8. I International Workshop on Challenges and Trends Beyond LTE-A
Anritsu Conformance Wireless Portfolio
9. I International Workshop on Challenges and Trends Beyond LTE-A
Chipset Design /
Core UE R&D
Integration /
Conformance
System Test
Test
Operator
Acceptance
Test (IOT)
Production
NEW
MD8430A
Signaling Tester with RTD
(Operator Acceptance Library)
MD8430A
Signaling Tester with RTD
(L1/L2, Protocol Stack Test)
MD8475A
Signaling Tester
(Application Test)
ME7873L
RF Conformance
Test System (RF CT)
MS269xA & MS2830A
Signal Analyzer
MG3700A
Signal Generator
MD1230B
Data Quality Analyzer
MT8820C
Radio Communication
Analyzer
(RF Parametric Test)
ME7834
Mobile Device Test
Platform (Protocol CT)
MT8820C
Radio Communication
Analyzer
MF6900A
Fading Simulator
ME7834
Mobile Device Test
Platform (Operator
Acceptance)
(UE Calibration and
RF Parametric Test)
10. I International Workshop on Challenges and Trends Beyond LTE-A
Market Requirements / Anritsu Portfolio
RTD
Chipset / UE
Development
Flexible test development
to support needs of global carriers / UE venders
IMS Signaling
IMS Signaling
Sequence Editing
Sequence Editing
Audio/ Video
Audio/ Video
Quality
Quality
VoLTE Functional
VoLTE Functional
Performance
Performance
Interworking
Interworking
Radvision ProLab
MD8430A
MD8480C
CSCF Function
UE
Integration
Focused on primarily functional requirements
versus signaling requirements
Audio Quality
Audio Quality
VoLTE Functional
Carrier Acceptance
Test
Conformance Test
IMS Signaling
IMS Signaling
Performance
Interworking
MD8475A
Focused on acceptance and certification testing
for carrier and GCF/PTCRB
Functional *
Audio/ Video
Quality *
Performance *
(*) Specific test items required by Carrier / CT
ME7834L
11. I International Workshop on Challenges and Trends Beyond LTE-A
Example Model for UE development phase
Commercial UE Development
System Test, Functional Test
H/W Part Development
OS / Application SW Group
Application Test, Throughput Test
Integration
System Test
Functional Test
Regression Test
Android OS Integration
Windows OS Integration
Application SW Integration
S/W Part Development
Built-in Completed OS
Core / Platform R&D
Protocol
Stack
Qualcomm
Regional Group / Localization
CAT, CT, Field Test
Others
North America Group
Operator
China Group
ST-Ericsson
Baseband
Development
Operator Requirement
Feedback
Operator
Europe Group
Operator
・・・・・・・
Operator
・・・・・・・
Operator
・・・・・・・
Chipset Venders
12. I International Workshop on Challenges and Trends Beyond LTE-A
Target Segment and Application
Commercial UE R&D
– Integration / System Test
System Test
Integration
-Functional
verification
-Performance
verification
-Various internal
root checking
-Automated
regression testing
Service interruption
Simultaneous multi-call (voice, video, packet, SMS)
Continuous calls, SMS
Semi-normal test, abnormal test
Call connectivity and stability (CS-FB, SVLTE, VoLTE)
Handover reliability (InterRAT, IntraRAT, SR-VCC)
System determination / roaming reliability
Battery performance test
Data throughput performance
Performance optimization
Bench marking with competition
Test automation
Integration / System test
Sanity Test
Functional Test
Stress Test
Performance Test
Regression Test
Telephony service (voice, video, data, CSFB, VoLTE)
Supplementary service
Messaging service (SMS/MMS, CB-SMS, CMAS)
Data communication applications
Mobile Service / IMS tests
Application Software
A lot of items need to be
related to IMS type
environment
13. I International Workshop on Challenges and Trends Beyond LTE-A
Mobile Apps Emulation for
Smartphone & Tablets
•
14. I International Workshop on Challenges and Trends Beyond LTE-A
Wi-fi Offload
• WiFi Data off-load test
– Data traffic will grow to very high due to expand smartphones
rapidly
• Most of NW operators have to consider to off load data to WiFi
access
Current
Near future
3G/LTE
Access
Network
3G/LTE
Access
Network
Core Network
Internet
Core Network
Internet
WiFi (LAN)
Access
Network
WiFi (LAN)
Access
Network
To ensure parental control
To execute roaming from public wireless LAN
Handover between cellular network
Smartphone developers have to test procedure in authentication of roaming
and confirm ciphering condition on user data
16. I International Workshop on Challenges and Trends Beyond LTE-A
Cell Master
PIM Master
VNA Master
Sprectrum Master
Anritsu Handhelds Portfolio
BTS Master
17. I International Workshop on Challenges and Trends Beyond LTE-A
Bench top equipment x Handhelds
Instrument Carts = Bad Idea!
18. I International Workshop on Challenges and Trends Beyond LTE-A
Product Differentiation
MS202xB
20 GHz VNA
(No SPA)
MS202xB/3xB
4/6 GHz VNA
4/6 GHz SPA
MS202xC/3xC
6/20 GHz VNA !
9/20 GHz SPA !
•B-Series offers:
•Coverage Mapping
•C-Series is over 2x
bandwidth of competitive
handhelds
•Freq/Time and now
Distance Domain
•Freq/Time and now
Distance Domain
•Aggressive pricing
•Benchtop in your hand
•AM/FM/PM Demod
MS202xA/3xA
4/6 GHz VNA
4/7.1 GHz SPA
19. I International Workshop on Challenges and Trends Beyond LTE-A
Passive Intermodulation (PIM) testing
20. I International Workshop on Challenges and Trends Beyond LTE-A
What is Passive Intermodulation (PIM)
TX signals at site
Passive Intermodulation (PIM)
F1
F2
Passive Intermodulation (PIM)
IM 3
IM 3
IM 5
IM 5
IM 7
IM 7
IM 9
IM 9
• PIM = interference
• PIM = new frequencies generated by Tx signals at a cell site
when they encounter “non-linear” junctions in the RF path
• PIM falling in an operator’s uplink can elevate the noise
floor:
▪ Dropped calls
▪ Access failures
▪ Slower data rates
21. I International Workshop on Challenges and Trends Beyond LTE-A
What is non-linear at a cell site?
• Loose metal-to-metal contacts
– Poorly terminated RF connectors
– Metal flakes inside connectors
– Loose RF connectors
– Metal flashing on rooftops
– Loose rivets, screws, etc.
• Rusty / corroded surfaces
• Non-linear materials
– Nickel / Steel
– Ferrite
Nov-13
22. I International Workshop on Challenges and Trends Beyond LTE-A
What does PIM look like to the operator?
QUIE
T
BUS
Y
QUIET
High
average
noise
level
BUSY
PIM
Repair
Lower
average
noise level
23. I International Workshop on Challenges and Trends Beyond LTE-A
First Generation PIM Master
• Introduced PIM Master™
Dec. 2010
• Distance-to-PIM™
technology
• 43 to 46 dBm output power
(20 to 40 W)
• Controlled using:
Three models:
850 MHz, 900 MHz, 1900/2100 MHz
–
–
–
–
BTS Master
Cell Master
Site Master
Spectrum Master
24. I International Workshop on Challenges and Trends Beyond LTE-A
New Second Generation PIM Master
• World’s first:
– battery operated
– high power PIM analyzer
• Lightweight / small size
– one-half the weight
– one-forth the size
Six models:
700 MHz (U/L), 850 MHz, 900 MHz
1800 MHz, 1900 MHz, 1900/2100 MHz, 2600 MHz
• 25 to 46 dBm (0.3 to 40
W)
• Distance-to-PIM™
• No external controller
required
25. I International Workshop on Challenges and Trends Beyond LTE-A
MW82119A – PIM testing at top of the tower
Remote Radio Head (RRH) sites
• Fiber & DC power to RF unit
• RF path is jumper cable + antenna
• PIM sources reduced, but not
eliminated
• Traditional test equipment not
useful:
– Heavy
– No AC power
• MW82119A is the solution:
– Light weight
– Battery operation
– Remote control option
26. I International Workshop on Challenges and Trends Beyond LTE-A
Thanks for your attention!
Free LTE Trainning avaiable in the link bellow:
http://www.anritsu.com/en-US/Services-Support/Training-Education/index.aspx
Adryele Neves – Account Manager
adryele.neves@anritsu.com
+55 11 3283-2511
+55 11 99218-8239