BJTのデバイスモデリングに必要な測定項目です。

1. Reverse Early Voltage Characteristic
Ie vs. hFE
Reverse DC Beta Characteristic
Forward Early Voltage Characteristic
Ic vs. hFE
IV
hFE-Ic Characteristic
Ic vs.Vce(sat)
BJT Vce(sat) -Ic Characteristic
Ic vs.Vbe(sat)
Vbe(sat) -Ic Characteristic
Vce vs.Cobo
C-B Capacitance Characteristic
CV
Veb vs.Cibo
E-B Capacitance Characteristic
BJT .mmap - 2008/06/11 -