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Device Modeling Report

COMPONENTS: Power MOSFET (Professional Model)
PART NUMBER: TPCA8128
MANUFACTURER: TOSHIBA
Body Diode (Professional Model)

Bee Technologies Inc.

All Rights Reserved Copyright (c) Bee Technologies Inc. 2010
1
MOSFET MODEL
PSpice model
parameter
LEVEL
L
W
KP
RS
RD
VTO
RDS
TOX
CGSO
CGDO
CBD
MJ
PB
FC
RG
IS
N
RB
PHI
GAMMA
DELTA
ETA
THETA
KAPPA
VMAX
XJ
UO

Model description
Channel Length
Channel Width
Transconductance
Source Ohmic Resistance
Ohmic Drain Resistance
Zero-bias Threshold Voltage
Drain-Source Shunt Resistance
Gate Oxide Thickness
Zero-bias Gate-Source Capacitance
Zero-bias Gate-Drain Capacitance
Zero-bias Bulk-Drain Junction Capacitance
Bulk Junction Grading Coefficient
Bulk Junction Potential
Bulk Junction Forward-bias Capacitance Coefficient
Gate Ohmic Resistance
Bulk Junction Saturation Current
Bulk Junction Emission Coefficient
Bulk Series Resistance
Surface Inversion Potential
Body-effect Parameter
Width effect on Threshold Voltage
Static Feedback on Threshold Voltage
Mobility Modulation
Saturation Field Factor
Maximum Drift Velocity of Carriers
Metallurgical Junction Depth
Surface Mobility

All Rights Reserved Copyright (c) Bee Technologies Inc. 2010
2
Transconductance Characteristics
Circuit Simulation Result
200
Measurement
Simulation

150

Gf s (S)

100

50

0

0

20

40

60

80

100

Drain Current ID (-A)

Comparison table
gfs(S)

-Id(A)

Measurement

Simulation

Error (%)

2
5
10

27.000
42.000
62.000

27.849
43.330
60.195

3.14
3.17
-2.91

20
50
100

85.000
127.000
169.000

83.059
125.256
168.304

-2.28
-1.37
-0.41

All Rights Reserved Copyright (c) Bee Technologies Inc. 2010
3
Vgs-Id Characteristics
Circuit Simulation result
-100A

-80A

-60A

-40A

-20A

0A
0V

-1.0V

-2.0V

-3.0V

-4.0V

I(V3)
V_V1

Evaluation circuit
V3

0Vdc

U1
TPCA8128
V1

V2
-10

0Vdc

0

All Rights Reserved Copyright (c) Bee Technologies Inc. 2010
4
Comparison Graph
Circuit Simulation Result
100
Measurement
Simulation

Drain Current ID (-A)

80

60

40

20

0
0.0

1.0
2.0
3.0
Gate - Source Voltage VGS (-V)

4.0

Simulation Result

-VGS(V)

-ID(A)

Measurement

Error (%)
Simulation

2

1.850

1.912

3.36

5
10
20
40
60
80

1.950
2.050
2.200
2.400
2.550
2.700

1.996
2.093
2.232
2.435
2.595
2.734

2.37
2.08
1.46
1.46
1.78
1.25

100

2.850

2.858

0.28

All Rights Reserved Copyright (c) Bee Technologies Inc. 2010
5
Rds(on) Characteristics
Circuit Simulation result
-20.0A
-17.5A
-15.0A
-12.5A
-10.0A
-7.5A
-5.0A
-2.5A
0A
0V

-20mV

-40mV

-60mV

-75mV

I(V3)
V_VDS

Evaluation circuit
V3

0Vdc

U1
TPCA8128

VDS

0Vdc
V1
-10

0

Simulation Result
ID= -17A, VGS= -10V
R DS (on)

mΩ

Measurement
3.700

Simulation
3.698

Error (%)
-0.07

All Rights Reserved Copyright (c) Bee Technologies Inc. 2010
6
Gate Charge Characteristics
Circuit Simulation result
-20V

-15V

-10V

-5V

0V
0

40n

80n

120n

160n

V(W1:4)
Time*1mA

Evaluation circuit

U1
TPCA8128

+

I1

I2
34

VDD

-

I1 = 0
I2 = 1m
TD = 0
TR = 5n
TF = 5n
PW = 600u
PER = 1000u

D2
Dbreak

ION = 0uA
IOFF = 1mA
W

W1

0

-24

0

Simulation Result
VDD= -24V ,ID=-34A
,VGS= -10V
Qgs
nC
Qgd
nC
Qg
nC

Measurement
11.000
30.000
115.000

Simulation

Error (%)

10.979
30.436
114.288

-0.19
1.45
-0.21

All Rights Reserved Copyright (c) Bee Technologies Inc. 2010
7
Capacitance Characteristics

Measurement
Simulation

Simulation Result

Cbd(pF)
VSD(V)
0.1
0.2
0.5
1
2
5
10
20
30

Measurement
360.000
325.000
265.000
220.000
175.000
130.000
100.000
77.000
65.000

Simulation

Error (%)

359.600
325.200
266.300
219.100
175.500
127.870
99.690
77.430
66.710

-0.11
0.06
0.49
-0.41
0.29
-1.64
-0.31
0.56
2.63

All Rights Reserved Copyright (c) Bee Technologies Inc. 2010
8
Switching Time Characteristics
Circuit Simulation result
-14V

-12V

-10V

-8V

-6V

-4V

-2V

0V
0.92us
1.00us
1.08us
V(U1:4)
V(U1:5)/1.5

1.16us

1.24us

1.32us

Time

Evaluation circuit
L2

RL

50nH

0.88

U1
TPCA8128
L1

30nH
R2
4.7

R1

4.7
V2

PER = 20u
PW = 10u
TF = 5n
TR = 5n
TD = 1u
V2 = 20
V1 = 0

VDD
-15Vdc

0

Simulation Result
ID= -17A, VDD= -15V
VGS=0/-10V
Ton
ns

Measurement
21.000

Simulation

Error (%)

20.792

-0.82

All Rights Reserved Copyright (c) Bee Technologies Inc. 2010
9
Output Characteristics
Circuit Simulation result
-100A

-10

-3
-2.8

-3.2
-3.6
-3.8

-80A

-60A

-4.5

-2.6
-2.5

-40A

-2.4
-2.3

-20A

-2.2
VGS= -2.1
0A
0V

-1.0V

-2.0V

-3.0V

-4.0V

I(V3)
V_V2

Evaluation circuit

V3

0Vdc
U1
TPCA8128
V2
-4
V1
0

0

All Rights Reserved Copyright (c) Bee Technologies Inc. 2010
10
BODY DIODE SPICE MODEL
Forward Current Characteristics
Circuit Simulation Result
100A

10A

1.0A

100mA
0V

0.2V
I(Vsense)

0.4V

0.6V

0.8V

1.0V

1.2V

V_VDS

Evaluation Circuit

Vsense
0Vdc

VDS

U1
TPCA8128
VGS

0Vdc

0

All Rights Reserved Copyright (c) Bee Technologies Inc. 2010
11
Comparison Graph
Circuit Simulation Result

Drain reverse current IDR (A)

100.000

Measurement
Simulation

10.000

1.000

0.100

0

0.2

0.4

0.6

0.8

1

1.2

Drain - Source voltage VDS (V)

Simulation Result

IDR(A)
0.1
0.2
0.5
1
2
5
10
20
50
100

VDS (V)
Measurement
Simulation
0.600
0.599
0.620
0.621
0.650
0.651
0.675
0.674
0.700
0.699
0.735
0.737
0.775
0.773
0.820
0.822
0.920
0.918
1.030
1.031

Error (%)
-0.15
0.18
0.12
-0.14
-0.16
0.25
-0.20
0.30
-0.23
0.09

All Rights Reserved Copyright (c) Bee Technologies Inc. 2010
12
Reverse Recovery Characteristics
Circuit Simulation Result
400mA
300mA
200mA
100mA
-0mA
-100mA
-200mA
-300mA
-400mA
0.2us 0.4us
I(R1)

0.6us

0.8us

1.0us

1.2us

1.4us

1.6us

1.8us

Time

Evaluation Circuit

R1
50

V1 = -9.4v
V2 = 10.6v
TD = 20ns
TR = 10ns
TF = 10ns
PW = 1us
PER = 100us

V1
U1
DTPCA8128_P

0

Compare Measurement vs. Simulation
Measurement

Simulation

Error (%)

trj

ns

20.000

20.127

0.63

trb

ns

120.000

119.582

-0.35

trr

ns

140.000

139.709

-0.21

All Rights Reserved Copyright (c) Bee Technologies Inc. 2010
13
Reverse Recovery Characteristics

Reference

Measurement

Trj= 20 (ns)
Trb= 120 (ns)
Conditions:Ifwd=lrev=0.2(A),Rl=50

Example

Relation between trj and trb

All Rights Reserved Copyright (c) Bee Technologies Inc. 2010
14

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SPICE MODEL of TPCA8128 (Professional+BDP Model) in SPICE PARK

  • 1. Device Modeling Report COMPONENTS: Power MOSFET (Professional Model) PART NUMBER: TPCA8128 MANUFACTURER: TOSHIBA Body Diode (Professional Model) Bee Technologies Inc. All Rights Reserved Copyright (c) Bee Technologies Inc. 2010 1
  • 2. MOSFET MODEL PSpice model parameter LEVEL L W KP RS RD VTO RDS TOX CGSO CGDO CBD MJ PB FC RG IS N RB PHI GAMMA DELTA ETA THETA KAPPA VMAX XJ UO Model description Channel Length Channel Width Transconductance Source Ohmic Resistance Ohmic Drain Resistance Zero-bias Threshold Voltage Drain-Source Shunt Resistance Gate Oxide Thickness Zero-bias Gate-Source Capacitance Zero-bias Gate-Drain Capacitance Zero-bias Bulk-Drain Junction Capacitance Bulk Junction Grading Coefficient Bulk Junction Potential Bulk Junction Forward-bias Capacitance Coefficient Gate Ohmic Resistance Bulk Junction Saturation Current Bulk Junction Emission Coefficient Bulk Series Resistance Surface Inversion Potential Body-effect Parameter Width effect on Threshold Voltage Static Feedback on Threshold Voltage Mobility Modulation Saturation Field Factor Maximum Drift Velocity of Carriers Metallurgical Junction Depth Surface Mobility All Rights Reserved Copyright (c) Bee Technologies Inc. 2010 2
  • 3. Transconductance Characteristics Circuit Simulation Result 200 Measurement Simulation 150 Gf s (S) 100 50 0 0 20 40 60 80 100 Drain Current ID (-A) Comparison table gfs(S) -Id(A) Measurement Simulation Error (%) 2 5 10 27.000 42.000 62.000 27.849 43.330 60.195 3.14 3.17 -2.91 20 50 100 85.000 127.000 169.000 83.059 125.256 168.304 -2.28 -1.37 -0.41 All Rights Reserved Copyright (c) Bee Technologies Inc. 2010 3
  • 4. Vgs-Id Characteristics Circuit Simulation result -100A -80A -60A -40A -20A 0A 0V -1.0V -2.0V -3.0V -4.0V I(V3) V_V1 Evaluation circuit V3 0Vdc U1 TPCA8128 V1 V2 -10 0Vdc 0 All Rights Reserved Copyright (c) Bee Technologies Inc. 2010 4
  • 5. Comparison Graph Circuit Simulation Result 100 Measurement Simulation Drain Current ID (-A) 80 60 40 20 0 0.0 1.0 2.0 3.0 Gate - Source Voltage VGS (-V) 4.0 Simulation Result -VGS(V) -ID(A) Measurement Error (%) Simulation 2 1.850 1.912 3.36 5 10 20 40 60 80 1.950 2.050 2.200 2.400 2.550 2.700 1.996 2.093 2.232 2.435 2.595 2.734 2.37 2.08 1.46 1.46 1.78 1.25 100 2.850 2.858 0.28 All Rights Reserved Copyright (c) Bee Technologies Inc. 2010 5
  • 6. Rds(on) Characteristics Circuit Simulation result -20.0A -17.5A -15.0A -12.5A -10.0A -7.5A -5.0A -2.5A 0A 0V -20mV -40mV -60mV -75mV I(V3) V_VDS Evaluation circuit V3 0Vdc U1 TPCA8128 VDS 0Vdc V1 -10 0 Simulation Result ID= -17A, VGS= -10V R DS (on) mΩ Measurement 3.700 Simulation 3.698 Error (%) -0.07 All Rights Reserved Copyright (c) Bee Technologies Inc. 2010 6
  • 7. Gate Charge Characteristics Circuit Simulation result -20V -15V -10V -5V 0V 0 40n 80n 120n 160n V(W1:4) Time*1mA Evaluation circuit U1 TPCA8128 + I1 I2 34 VDD - I1 = 0 I2 = 1m TD = 0 TR = 5n TF = 5n PW = 600u PER = 1000u D2 Dbreak ION = 0uA IOFF = 1mA W W1 0 -24 0 Simulation Result VDD= -24V ,ID=-34A ,VGS= -10V Qgs nC Qgd nC Qg nC Measurement 11.000 30.000 115.000 Simulation Error (%) 10.979 30.436 114.288 -0.19 1.45 -0.21 All Rights Reserved Copyright (c) Bee Technologies Inc. 2010 7
  • 8. Capacitance Characteristics Measurement Simulation Simulation Result Cbd(pF) VSD(V) 0.1 0.2 0.5 1 2 5 10 20 30 Measurement 360.000 325.000 265.000 220.000 175.000 130.000 100.000 77.000 65.000 Simulation Error (%) 359.600 325.200 266.300 219.100 175.500 127.870 99.690 77.430 66.710 -0.11 0.06 0.49 -0.41 0.29 -1.64 -0.31 0.56 2.63 All Rights Reserved Copyright (c) Bee Technologies Inc. 2010 8
  • 9. Switching Time Characteristics Circuit Simulation result -14V -12V -10V -8V -6V -4V -2V 0V 0.92us 1.00us 1.08us V(U1:4) V(U1:5)/1.5 1.16us 1.24us 1.32us Time Evaluation circuit L2 RL 50nH 0.88 U1 TPCA8128 L1 30nH R2 4.7 R1 4.7 V2 PER = 20u PW = 10u TF = 5n TR = 5n TD = 1u V2 = 20 V1 = 0 VDD -15Vdc 0 Simulation Result ID= -17A, VDD= -15V VGS=0/-10V Ton ns Measurement 21.000 Simulation Error (%) 20.792 -0.82 All Rights Reserved Copyright (c) Bee Technologies Inc. 2010 9
  • 10. Output Characteristics Circuit Simulation result -100A -10 -3 -2.8 -3.2 -3.6 -3.8 -80A -60A -4.5 -2.6 -2.5 -40A -2.4 -2.3 -20A -2.2 VGS= -2.1 0A 0V -1.0V -2.0V -3.0V -4.0V I(V3) V_V2 Evaluation circuit V3 0Vdc U1 TPCA8128 V2 -4 V1 0 0 All Rights Reserved Copyright (c) Bee Technologies Inc. 2010 10
  • 11. BODY DIODE SPICE MODEL Forward Current Characteristics Circuit Simulation Result 100A 10A 1.0A 100mA 0V 0.2V I(Vsense) 0.4V 0.6V 0.8V 1.0V 1.2V V_VDS Evaluation Circuit Vsense 0Vdc VDS U1 TPCA8128 VGS 0Vdc 0 All Rights Reserved Copyright (c) Bee Technologies Inc. 2010 11
  • 12. Comparison Graph Circuit Simulation Result Drain reverse current IDR (A) 100.000 Measurement Simulation 10.000 1.000 0.100 0 0.2 0.4 0.6 0.8 1 1.2 Drain - Source voltage VDS (V) Simulation Result IDR(A) 0.1 0.2 0.5 1 2 5 10 20 50 100 VDS (V) Measurement Simulation 0.600 0.599 0.620 0.621 0.650 0.651 0.675 0.674 0.700 0.699 0.735 0.737 0.775 0.773 0.820 0.822 0.920 0.918 1.030 1.031 Error (%) -0.15 0.18 0.12 -0.14 -0.16 0.25 -0.20 0.30 -0.23 0.09 All Rights Reserved Copyright (c) Bee Technologies Inc. 2010 12
  • 13. Reverse Recovery Characteristics Circuit Simulation Result 400mA 300mA 200mA 100mA -0mA -100mA -200mA -300mA -400mA 0.2us 0.4us I(R1) 0.6us 0.8us 1.0us 1.2us 1.4us 1.6us 1.8us Time Evaluation Circuit R1 50 V1 = -9.4v V2 = 10.6v TD = 20ns TR = 10ns TF = 10ns PW = 1us PER = 100us V1 U1 DTPCA8128_P 0 Compare Measurement vs. Simulation Measurement Simulation Error (%) trj ns 20.000 20.127 0.63 trb ns 120.000 119.582 -0.35 trr ns 140.000 139.709 -0.21 All Rights Reserved Copyright (c) Bee Technologies Inc. 2010 13
  • 14. Reverse Recovery Characteristics Reference Measurement Trj= 20 (ns) Trb= 120 (ns) Conditions:Ifwd=lrev=0.2(A),Rl=50 Example Relation between trj and trb All Rights Reserved Copyright (c) Bee Technologies Inc. 2010 14