1. APRIL 28, 2015
CYTEC.COM
© Cytec Industries
Material Cards For Structural Analysis
Fabio Bressan

2. 2© Cytec Industries
Goals
MC meaning
MC importance
MC methodology

3. 3© Cytec Industries
The MC for FRP LAMINA are a set of parameters that
describe the stiffness and strength performance in
direction 1, 2 and 3.
Material Card Meaning
Stiffness
Strength

4. 4© Cytec Industries
MTM49-3 T700S
Modulus of elasticity in longitudinal direction E1 [MPa] XXXXXX
Modulus of elasticity in transversal direction E2 [MPa] XXXXXX
Poisson's ratio NU12 - XXXXXX
Inplane shear modulus G12 [MPa] XXXXXX
Transverse shear modulus for shear in 1-Z plane G13 (G1,Z) [MPa] XXXXXX
Transverse shear modulus for shear in 2-Z plane G23 (G2,Z) [MPa] XXXXXX
Mass density RHO [ton/mm³] XXXXXX
Tension stress limit Xt (11) [MPa] XXXXXX
Compression stress limit Xc (11) [MPa] XXXXXX
Tension stress limit (transverse direction) Yt (22) [MPa] XXXXXX
Compression stress limit (transverse direction) Yc (22) [MPa] XXXXXX
Shear stress limit S [MPa] XXXXXX
Interlaminar Shear stress ILSS (SB) [MPa] XXXXXX
Thickness (single ply) th [mm] XXXXXX
Example Of Linear Material Card

5. 5© Cytec Industries
LINEAR
ANALYSIS
FPF
Linear Analysis
First Ply Failure
IMPLICIT
NON LINEAR
ANALYSIS
PPFA
Progress Ply Failure
Analysis
EXPLICIT
NON LINEAR
ANALYSIS
Crash with:
Rupture
Delamination and
Failure Modes
Failure Criteria
80%
of Classic Designs
20%
of Classic Designs
100%
of Crash Designs
Homogeneous Anisotropic (Composite)

6. 6© Cytec Industries
Productivity
imperfections
Elasto-plastic
behavior
Deterministic
vs
Probabilistic
What I Learned From My Experience

7. 7© Cytec Industries
Ferrari vs Cytec Material Card
High correlation between virtual non-
linear CYTEC Material Card and
experimental compression’s curve
CYTEC non-linear
Material card has
slight low elastic
modulus in tensionWrong Material Card
Experimental Curve
TENSILE
ASTM
3039
COMPRESSION
ASTM D695

8. 8© Cytec Industries
Cytec Methodology
Stress/strain curves editing by
standard mechanical test
(ASTM) and in parallel Virtual
modelling of mesoscale FE
Create Linear and non-linear
virtual material cards for FEM
for different kind of code
(RADIOSS, NASTRAN, etc.)
Prove Material Cards with
Correlation of Experimental-
Numerical test for Bending and
Torsional with a flexible Jig
1
2
3

9. 9© Cytec Industries
MC are not a simple
collection of ASTM data
Accurate MC can save a
lot of money and time
MC are non linear for
complex failure (crash)
Conclusions
Methodology to create
MC and a Methodology
to prove the accuracy
MC are stochastic and
not deterministic
MC can help to design
and compare new CYTEC
materials virtually

10. APRIL 28, 2015
CYTEC.COM
© Cytec Industries
Thank You