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Progrese Noi in Dezvoltarea Tehnologiilor si Echipamentelor de Examinari Nedistructive
New Advances in Development of NDT Technologies and Equipment
Welcome at EVIDENT
Power You Can Carry
OmniScan™ X3 64 Phased Array and TFM Flaw Detector
Internal Positioning
Cost to Customer
Features
/
Benefits
SX PA
16:64PR
1 PA group
SX UT
1 UT channel
X3 16:64PR
2 PA/TFM groups
1 TOFD
TFM 32 el.
X3 16:128PR
8 groups
2 TOFD
TFM 32 el.
X3 32:128PR
8 groups
2 TOFD
TFM 64 el.
Page 5
X3 64 (64:128PR)
8 groups
2 TOFD
TFM 128 el.
OmniScan X3 Series
Power You Can Carry
OmniScan™ X3 64 Phased Array and TFM Flaw Detector
7
Better Agility and Mobility on the Job Site
Smaller and less cumbersome
than other 64-channel devices,
the true portability of this unit provides
increased convenience to the user and
flexibility for jobs where space is limited.
8
More Powerful Performance in a Rugged, Easy-to-Transport Unit
Twice the number of pulsers
contained in the same
reliable OmniScan X3 box.
64
Pulsers
Up to
128
TFM
Elements
9
Minimize the Learning Curve and Save Time by Reusing your Setups
This OmniScan has the same the user-
friendly interface and streamlined,
intuitive menu structure of the OmniScan
X3 flaw detector. Compatible with
OmniScan data files, it can load setup
parameters from other OmniScan X3
models, so users can preserve their
established settings.
10
Accomplish More in Less Time
The OmniScan X3 64
internal storage holds larger
amounts of inspection data
up to 1 TB), enabling you to
perform bigger scanning jobs
and stay on site longer
without needing to transfer
your files.
1 TB
Memory
11
Feel Supported, Wherever You Go
Offering proven reliability, the OmniScan X3 64 unit is built tough
to withstand harsh environments and challenging inspection
demands. Backed by our global customer support, geolocation,
and wireless connectivity, you can maintain high productivity and
work efficiency while in the field.
12
ü IP65 certified rain and dust proof
ü Tested in accordance with MIL-STD-810G for shocks, vibrations,
thermal shocks, and drops
ü User-replaceable cooling fan
ü Onboard GPS*
ü Software updates via the Olympus Scientific Cloud™ (OSC)
*GPS not available in all regions. Contact your local Olympus representative for more details.
Work More Efficiently and Confidently
The unique enclosure of the OmniScan X3 series is backed up by
powerful certifications and specifications:
13
Maximize Your Productivity
Facilitate complex and specialized inspection procedures, such as new-fabrication welds in pressure
vessels, using Olympus’ WeldSight™ software in tandem with the OmniScan X3 64 unit. Installing the
WeldSight Remote Connect app on the flaw detector enables you to control the acquisition and instantly
view your phased array (PA) data on a PC. Increase your productivity by exploiting the customizable user
interface and advanced analysis tools and optimizing your equipment configuration to match your needs.
14
Thoroughly Examine Thicker Welds and Coarse-Grained Materials
Improved phased array focusing
capabilities supported by the larger
active aperture enables imaging
deeper into thick welds and thick-
walled material.
15
Expand Your PA and TFM Capabilities
Increase your potential to meet the
challenges of your customers and develop
new procedures for a wider range of
applications. Gain the power to drive
advanced PA probes such as our Dual Linear
Array™ or Dual Matrix Array™ probes or
customized probes to achieve higher-quality
imaging of acoustically challenging materials.
16
Enhance the Probability of Detection for Oddly Oriented Flaws
3 beam skews: 0° (nominal), −15°, and +15°
Optimize your detection strategy using a
Dual Matrix Array weld inspection
configuration and incorporating off-axis beam
skew groups onboard the OmniScan X3 64
unit. Viewing multiple beam skews
simultaneously increases the likelihood of
detecting oddly oriented or misoriented
critical flaws without having to perform more
scanning passes.
17
Total Focusing Method (TFM) Made Accessible
The improved speed
and efficiency of the
OmniScan X3 64
model’s TFM makes it
more feasible to
incorporate as a regular
part of your inspection
process.
The Acoustic Influence
Map (AIM) tool
provides you with an
instant visual model of
the sensitivity based on
your TFM wave set (or
mode), settings, and
simulated reflector.
18
Perform Faster TFM
Using a full 64-element
aperture increases the
acquisition speed of TFM,
which is further optimized
by the system’s sparse
firing algorithm.
Offering exponentially
faster acquisition rates,
our improved TFM
provides you with a
significant acquisition
speed increase
compared to our 32-
channel OmniScan X3
model.
Up to
4x
Faster
Using 64-
Element Probes
Up to
2x
Faster
With a 32-
Element
Aperture
19
Reach Your Peak Potential
128-element aperture capable, the OmniScan X3 64 unit’s TFM can be used for
specialized applications. Use the clear, crisp imaging provided by 64-channel TFM to
achieve more precise sizing and flaw positioning. Expand your potential to meet
increasingly demanding inspection requirements.
20
Ease Challenging Applications
Detect and distinguish smaller defects, using the high-quality imaging supported by the instrument’s 64-
channel capacity. Using larger, more powerful PA probes, you can attain a better resolution deeper in the
part and clearly see minute flaws such as high-temperature hydrogen attack (HTHA) before they attain the
critical phase.
21
Achieve Precision in Fiberglass and Composites
Offering lower pulse voltage limit options, the OmniScan X3 64 flaw detector enables you to eliminate front
wall echo saturation and see complete echo waveforms. Use this capability to exploit all detection options,
including the peak and edge, making your analysis more reliable.
22
Improved Performance in Attenuative Materials
The OmniScan X3 64 flaw detector offers better signal penetration in materials with high sound
attenuation. Its 1000 ns pulse width frequency capacity (true 0.5 MHz pulse) and 0.2 MHz lower bandwidth
enables you to use lower frequency probes, improving your ability to scan the entire volume of highly
attenuative materials, such as fiberglass and other composites.
OmniScan X3 flaw detector OmniScan X3 64 flaw detector
23
OmniScan™ X3 Phased Array Flaw Detector with Innovative TFM
Confidence You Can See
• The OmniScan X3 flaw detector is a
complete phased array toolbox.
Powerful tools, including total focusing
method (TFM) imaging and advanced
visualization capabilities, backed by its
high image quality enable you to
complete your inspection with greater
confidence.
24
Innovative and Efficient TFM – AIM Acoustic Influence Map
AIM - Confirm Your TFM Beam
Coverage in Advance
• The Acoustic Influence Map (AIM)
tool provides you with an instant
visual model of the sensitivity based
on your TFM mode, probe, settings,
and simulated reflector.
• The AIM tool takes the guesswork out
of creating your scan plan—visualize
the effect of a wave set (TFM mode),
see where sensitivity stops, and
adjust your scan plan accordingly.
25
OmniScan™ X3 Phased Array Flaw Detector with Innovative TFM
Up to Four TFM Modes Facilitate
Flaw Interpretation and Sizing
• Using different TFM modes (wave sets)
in the same inspection increases your
chances to detect irregularly oriented
indications. The OmniScan X3 flaw
detector provides up to four simultaneous
TFM modes to generate images from
different angles. The response and
characteristics from each mode - such as
the tip diffraction, corner trap, and defect
profile - can be used simultaneously to
confirm the flaw type and improve the
sizing capabilities.
26
OmniScan™ X3 64 - Benefit from 64-Pulser Phased Array
Exploit the full potential of 64-element
phased array probes using the
OmniScan X3 64 flaw detector to
achieve improved resolution at the
focal point.
• Slide 1: Acquired using a 32-channel
OmniScan X3 unit with a 64-element
probe (5L64-A32 model), this S-scan is a
high-quality image but the resolution
reflects the fact that only the middle 32
elements could be used for the focal
law.
27
OmniScan™ X3 64 - Benefit from 64-Pulser Phased Array
Exploit the full potential of 64-element
phased array probes using the
OmniScan X3 64 flaw detector to
achieve improved resolution at the
focal point.
• Slide 2: Using a full 64-element aperture
(5L64-A32 probe), the OmniScan X3 64
flaw detector provides better PA
resolution at the focal point, enabling you
to more easily distinguish indications that
are close together or in a cluster.
28
OmniScan™ X3 64 - Benefit from Full 128-Element Aperture TFM
Access Full 128-Element Aperture TFM
• Made possible by new generation
electronics, TFM imaging offers better
focusing capabilities for smaller indications
and an improved signal-to-noise ratio
(SNR). With its 128-element aperture
capacity, the OmniScan X3 64 model
provides enhanced image clarity.
• Slide 1: This TFM image was acquired with
64 elements of a 128-element probe
(3.5L128-I4 model) using an OmniScan X3
32-channel model.
29
Access Full 128-Element Aperture TFM
• Made possible by new generation
electronics, TFM imaging offers better
focusing capabilities for smaller indications
and an improved signal-to-noise ratio
(SNR). With its 128-element aperture
capacity, the OmniScan X3 64 model
provides enhanced image clarity.
• Slide 2: Here, the OmniScan X3 64 flaw
detector enabled us to use the full 128-
element aperture of our 3.5 MHz, 128-
element I4 probe. Note the improved
resolution and reduced background noise.
OmniScan™ X3 64 - Benefit from Full 128-Element Aperture TFM
Specifications Explained
31
OmniScan X3 Series
OmniScan X3 models
16:64PR, 16:128PR, or 32:128PR
OmniScan X3 64 model
64:128PR
32
Specifications OmniScan X3
(ref. 32:128PR)
OmniScan X3 64
64:128PR
Weight, Size, Enclosure, MXU
Software, Certifications, Receiver
Channels, and Group Quantity
Identical
Pulsers 32 64
TFM Maximum Aperture 64 (Extended Aperture) 128 (Extended Aperture)
Input Bandwidth 0.5 MHz to 18 MHz 0.2 MHz to 26.5 MHz
Maximum Pulse Width 500 ns 1000 ns (true 0.5 MHz)
Pulse Voltages (PA) 40 V, 80 V, 115 V Unipolar
Negative Square Pulse
5 V, 10 V, 20 V, 40 V, 60 V, and
80 V Bipolar Square Pulse
Internal SSD Storage Capacity 64 GB 1 TB
Specification Comparison
OmniScan X3 Series
33
Unipolar Negative versus Bipolar Square Pulse
OmniScan X3 64 Pulse Voltage Explained
OmniScan X3
model
OmniScan X3 64
model
−115 V
Maximum Unipolar
Pulse Voltage (no load)
−80 V
Maximum
+80 V
Maximum
Total Bipolar Pulse Voltage
(no load) = 160 V
Resulting effective voltage
on transducer is similar.
115 V Unipolar ≈ 80 V Bipolar
34
OmniScan X3 64 Pulse Width Explained
OmniScan X3
model
OmniScan X3 64
model
Maximum Pulse Width: 500 ns
1 MHz Pulse 0.5 MHz Pulse
Maximum Pulse Width
(Half of Bipolar Pulse):
1000 ns
35
OmniScan X3 display at minimum gain and
minimum pulse voltage (40 V)
OmniScan X3 64 display at minimum gain and
minimum pulse voltage (5 V)
Effect of Lower Pulse Voltage Limit
The OmniScan X3 64 flaw detector enables pulse voltages as low as 5 V (bipolar). This effectively
prevents front wall saturation and achieves increased precision on time-of-flight measurements.
36
OmniScan X3 with 5L64-A32 using only the middle
32 elements.
OmniScan X3 64 with the same 5L64-A32 probe and
configuration but using all 64 elements.
Effect of 64 Pulsers in Phased Array
The OmniScan X3 64 increased pulser count allows you to fully use the aperture of 64-element probes,
which has the potential to improve the resolution when focused on the defect location.
37
Effect of Larger Dual Probe on Thick Austenitic Weld
2.25DL32-A26 (2x 32 elements, 1 mm pitch). 2.25DL64-A(26) (2x 64 elements, 1 mm pitch).
OmniScan X3 OmniScan X3 64
The OmniScan X3 64 increased pulser count supports larger Dual Linear
and Dual Matrix Array probes which can significantly improve resolution
and sensitivity at great depths.
38
OmniScan X3 model using only the middle 64
elements (using aperture control) of a 3.5L128-I4
probe.
OmniScan X3 64 model with the same 3.5L128-I4
probe and configuration, using all 128 elements.
Effect of 128 Elements in Total Focusing Method (TFM) Imaging
The OmniScan X3 64 flaw detector enables you to use a full 128-element aperture of 128-element probes,
which can significantly improve the resolution and increase the beam coverage.
Software and Options
40
Phased Array and Ultrasonic Testing Data Analysis PC Software
OmniPC™ analysis software is
the computer-based companion
software for OmniScan X3
series flaw detectors. An
inspection tool created by
inspectors, OmniPC software
provides the power and
performance to handle all your
basic data analysis and
reporting needs.
OmniPC™ 5 Software
41
Complimentary Companion Software for OmniScan Flaw Detectors
OmniPC 5 software is free for download, including updates. OmniPC 5 is compatible with OmniScan MX2
and OmniScan SX data files (.opd) so you can compare inspection results over time.
• No HASP key!
• No product key!
• No renewal payments!
OmniPC running multiple program instances on multiple monitors
42
Optional Advanced Analysis Software for OmniScan X3 Series Data
WeldSight™ software’s comprehensive acquisition and analysis tools enable you to engineer compliant and
repeatable advanced phased array (PA), ultrasonic testing (UT), and time-of-flight diffraction (TOFD) weld
inspections. Pushing flaw characterization and sizing further, WeldSight software’s tools enable inspectors
to conduct thorough analyses that comply with strict validation requirements of international or internal
standards.
ü Complete code-compliant phased
array ultrasonic testing
ü Customizable data displays
ü Easy data merging and file
stitching
ü Optimized workflows for
rapid analysis
ü Advanced, customizable
reporting
43
Keep Pace with Production
With the WeldSight Remote Connect app, data files acquired on the OmniScan™ X3 series units are
transferred instantly to the WeldSight computer or laptop. The battery-operated unit enables greater setup
configuration flexibility and increased portability. The optional protection door helps keep out dust and
water splashes while the OmniScan X3 series flaw detector is controlled via WeldSight software.
WeldSight software performs live PAUT data acquisition with any OmniScan X3 model
44
Optional Special-Purpose Door for OmniScan X3 Series
Protect the connectors using the optional door that remains closed while the unit is connected to the
WeldSight computer. Installing the new OmniScan X3 special purpose door is a snap!
45
OmniScan X3 64 Launch Promotion
For a limited time, Olympus offers the OmniScan X3 64 flaw detector in combination with the WeldSight
software Inspection license and ES BeamTool. This combination of high-end products offers both live data
acquisition and advanced analysis in a portable package.
Ask Your Olympus Representative!
Additional Information and
FAQs
47
Q. What does the name “OmniScan X3 series” signify?
A: With the launch of the OmniScan X3 64 flaw detector, we introduced the product family name
“OmniScan X3 series,” which encompasses all available OmniScan X3 models. We chose the term
“series” as most specifications or capabilities are similar for all models. There are currently three
OmniScan X3 models (16:64PR, 16:128PR, and 32:128PR) and one OmniScan X3 64 model (64:128PR).
Q. Does new OmniScan X3 64 flaw detector offer all functionalities and perform all the applications that
the other OmniScan X3 models can?
A: Yes! Actually, in many cases, it offers either enhanced performance or expanded capabilities.
Q. Do my OmniScan X3 accessories, adaptors, and scanners also work on the new OmniScan X3 64
unit?
A: Absolutely!
General
48
Q. Will the batteries that I use in previous OmniScan models also work in the new OmniScan X3 64 unit?
A: Yes, as we use the same battery model for all flaw detectors in the OmniScan family.
Q. Why is only one battery shipped with OmniScan purchases?
A: We would like to keep including the second battery; however, many international carriers do not accept
a second battery and certain countries also have specific import regulations prohibiting it, which makes it
impossible to offer the second battery as a standard inclusion. Unfortunately for these reasons, the second
battery must be purchased separately.
Q. What is the battery life with the new OmniScan X3 64 flaw detector?
A: Similar to the other OmniScan X3 models: 5 hours of continuous operation with 2 fully charged
batteries installed.
Batteries
49
Q. Does the OmniScan X3 MXU onboard software also work on the new OmniScan X3 64 model?
A: Yes! The same software runs on both OmniScan X3 models.
Q. Can I reuse my MX2 and SX setup and data files with the new OmniScan X3 64 flaw detector?
A: You can, just like you can with any other OmniScan X3 model. Setup files will load directly on
OmniScan X3 series instruments and data files will load using OmniPC 5 software.
Q. Can I use a file I created on another OmniScan X3 model (32:128PR, for example) and load it on the
new OmniScan X3 64 flaw detector?
A: Definitely! You can also do the opposite (create a file on OmniScan X3 64 unit and load it in another
OmniScan X3 model). Please keep in mind that data may need to be adapted to the instrument’s
capabilities - for example, a setup file using 64 pulsers will be adjusted to 32 pulsers if loaded on a 32-
pulser instrument.
Compatibility
50
Q. Can the new OmniScan X3 64 unit be remotely operated using WeldSight software?
A: Yes! The objective of our launch promotion is specifically to encourage users to optimize that capability.
WeldSight software supports any model of the OmniScan X3 series when using the Inspection license
(preferably with ES BeamTool) along with the WeldSight Remote Connect app, which is available for
download for free on the Olympus IMS website.
Q. The new OmniScan X3 64 unit’s maximum pulse voltage is 80 V, while the other OmniScan X3 models
have a 115 V maximum. Why is the new OmniScan X3 64 flaw detector offering a lower maximum
voltage?
A: In reality, it’s not lower. The OmniScan X3 64 unit features a bipolar pulse, which is when a negative
voltage pulse is followed by an equally strong positive voltage pulse. Both the negative and positive pulses
combine to form a maximum 160 V peak-to-peak voltage. When the OmniScan X3 64 unit pulses at 80 V,
it sends 160 V to the probe. In practice, after the energy is transferred to the probe, the resulting sound
pressure from the OmniScan X3 64 unit’s 80 V bipolar pulse is in fact very similar to the resulting sound
pressure generated by the other OmniScan X3 models’ 115 V negative only pulse.
Advanced Topics
51
Q. Can I upgrade my current OmniScan X3 model to an OmniScan X3 64 model?
A: Unfortunately, no. Although there are many shared components between the
new OmniScan X3 64 unit and other OmniScan X3 models, the electronics that
power them are different, and upgrading is not possible. However, please discuss
trade-in options with your local Olympus representative if you’re interested.
Q. Can I update the onboard MXU software on the new OmniScan X3 64 flaw
detector?
A: Yes! The procedure is the same with all OmniScan X3 series instruments.
Please go to https://www.olympus-ims.com/en/service-and-support/downloads/,
download the latest MXU software, and follow the on-screen instructions. Or,
better yet, equip your OmniScan X3 64 flaw detector with a compatible wireless
LAN dongle (consult the User’s Manual for details) and get software updates
directly via the OmniScan Launcher.
Upgrades and Updates
52
Learn more about the OmniScan X3 64
flaw detector and download the training
package:
https://www.olympus-
ims.com/en/phasedarray/omniscan-x3/
Learn more about WeldSight software:
https://www.olympus-
ims.com/en/weldsight/
Download the latest MXU onboard
software for the OmniScan X3 series,
OmniPC 5 software, WeldSight software,
or the WeldSight Remote Connect app:
https://www.olympus-
ims.com/en/service-and-
support/downloads/
Online Resources
53
OmniScan X3 64 - Launch Promotion
For a limited time, Olympus offers the OmniScan X3 64 flaw detector in combination with the WeldSight
software Inspection license and ES BeamTool. This combination of high-end products offers both live data
acquisition and advanced analysis in a portable package.
Ask Your Olympus Representative!
54
OmniScan™ X3 Series – Up-grade & Trade-in
Up-grade up to OmniScan X3 32:128PR Trade-in from any MX / MX2 / X3 to OmniScan X3 64
55
Power You Can Carry
72DL PLUS - Precision Thickness Gauges
Internal Product Position
27MG
45MG
38DL PLUS
72DL PLUS - Standard
72DL PLUS - HF
Multilayer Measurement S/W
Product Position
72DL PLUS
Standard
Frequency
à
- Offers largest display
- Touchscreen
- Much faster update rate (up to
2KHz)
- Transducer frequency from 0.2
MHz to 30 MHz
72DL PLUS
High
Frequency
à
- Transducer frequency from 0.2
MHz to 125 MHz
- Thickness measurement capability
far below the existing 38DL PLUS
Multilayer
Measurement
S/W
à - Measure up to 6 layers
simultaneously
Internal Product Position
27MG
45MG
38DL PLUS
72DL PLUS - Standard
72DL PLUS - HF
Multilayer Measurement S/W
High Frequency: Up to 125MHz
High Speed: Up to 2000Hz PRF(Single Shot), 60Hz Display
Powerful Multilayer: Up to 6 individual layers
New Thickness Lows: Measure down to 12µm (plastic)
High Resolution: Up to 0.25µm
Lab Quality Measurements for the Production Floor
Overview
Product Key Features
1
01
Key Features
PC Interface Application: for plant
integration of workflow, inspection
management, alerts, and data analysis.
Efficient Data Management:
Internal data logging and PC Interface
to speed up data collection and review
Connected: supports wireless LAN
and Bluetooth®
Cloud Enabled: wireless connection
to the Olympus Scientific Cloud™
(OSC) and compatible OSC apps
Rugged: Designed for IP65
Large, Clear Screen: 7” high
resolution touchscreen WVGA display
New and Improved Measurement
Algorithm: Single shot measurements
up to 2KHz
Powerful Multilayer Software:
Measure up to 6 individual layers
simultaneously
New Thickness Lows: Measure
down to 20µm (metal), 12.7µm (plastic)
Easy Application Setup: create
custom applications to reduce device
setup time for routine inspections
New and Improved Measurement Algorithms
Single shot measurements
Measurement Rate up to 2KHz
Reliable measurement results at
high speed
Calibration, Gain, and Blank control
on frozen waveforms
Multilayer thickness measurement
of up to 6 layers
Versatile data presentations (A-
scan, B-scan, A/B-scan, Trend,
Zoom, Custom) to suit
application/user needs
Versatile data presentations to suit application/user needs
A-Scan B-Scan A/B-Scan
Zoom
Trend
Intuitive User Interface
Improved wave adjust menu
Intuitive workflow, allowing easy set up to
cover diverse and complex applications
User application files for fast configuration
recall
Inspection Data Files map the thickness
measurement locations on the part to the
ID numbers (“Part Map”)
Instrument locks
Designed for Manufacturing Environment & Portable Apps
Faster inspection
with go/no-go alarms
7” high-resolution WVGA
touchscreen display with wide-
viewing angle
Engineered to IP65 and drop
tested (MIL-STD-810G)
PC Interface Application
Create, Manage, Share, and
Analyze Data
Data Trending Dashboard
Build customized part maps with
clear inspection point
Bi-directional file transfer to and
from the gauge
Report Generation with
customized templates
Wireless Connectivity to OSC
User account creation and administrative level management
Register device(s)
Retrieve Calibration Certificate(s)
Monitor Device Health Information
Firmware Updates
Not just a product, but a complete solution
• On board part creation
• Part inspection
• Review inspection data files
72DL PLUS
• Create custom part
• Bidirectional transfer to multiple gauges
• Data trending dashboard
• Data Analysis
• Generate custom reports
Interface Application
• User Account Creation
• Register Device
• Retrieve Calibration Certificate(s)
• Monitor Device Health Information
• Firmware Updates
Cloud Connection
A Complete
Workflow
Solution
Product Appearance
1
02
Product Appearance | Front
Adjustment Knob
Easy parameter adjustments
Simple Button Design
Efficient navigation
Touchscreen Display
7” high-resolution WVGA
display with wide viewing
angle
Product Appearance | Top
Lemo Connector
Standard Frequency
Transducers
BNC Connector
High Frequency
Transducers
19 Pin Accessory Connector
Foot Switch and external
alarms
DC Power Connector
Mounting Points
Chest Strap/ Shoulder Strap
Product Appearance | Right
Data Port Release
Latch
Easy slide to open
cover
Mounting Points
Chest Strap/ Shoulder Strap
Micro HDMI Connector
External Display
USB A Connector
USB Storage, Bluetooth Mouse
Mini USB B Connector
PC for Data Transfer
Product Appearance | Back
Thumb Screws
To Open Battery
Compartment Cover
Pipe Stand
Mounting Points
High Frequency Transducers
1
03
High Frequency Contact Transducers
• NEW High Frequency Transducers
• M2104 – 125MHz
• M2102 – 75 MHz
• Built with three ceramic discs on front plate to prevent
wear from contact applications
• Minimal mechanical delay for improved thickness
ranges
• Probe Bubbler Assembly
• B126 – Used with M2100 series transducers
• Existing High Frequency Transducers (recommended)
• V215-BA-RM – 50 MHz (0.8 inch case diameter)
• V215-BB-RM – 50 MHz (0.4 inch case diameter)
High Frequency Contact Applications
Applications
• Measurements at 50 MHz
• Multilayer paint (125 MHz)
• Components
• Multilayer plastics
• Windshields
Energy
General Manufacturing
All Other
Industries
Aerospace
Automotive
• Turbine blades
• Paint/ Coatings on
composites
• Multilayer aircraft window
• Thin material
• Single & multilayer coatings
• Multilayer plastics and materials
• Raw Materials (Coil, Tubing,
Plates)
• Medical (Thin-walled tubing,
packaging)
• Contact Lenses
INDUSTRY SEGMENTS
(according to CRM classifications)
APPLICATION AREAS APPLICATION
Aerospace
Manufacturers
Turbine Blade
Radome
Turbine Blade
Manufacturers
Repair and Maintenance
Energy
Aerospace
Automotive
General
Manufacturing
Medical
Multilayer Aircraft
Window
Multilayer Paint on
Composites
Multilayer Plastics Thin Coatings
Velocity
Measurements
Applications - Aerospace
Applications - Aerospace
INDUSTRY SEGMENTS
(according to CRM classifications)
APPLICATION AREAS APPLICATION
Automotive
Manufacturers
Multilayer Paint on
Metal
Multilayer Paint on
Plastics
Automotive Suppliers
Fuel Tank Manufacturers
Aerospace
Automotive
General
Manufacturing
Medical
Energy
Multilayer Plastic
Fuel Tanks
Multilayer
Windshields
Multilayer Coatings Thin Coatings
Velocity
Measurements
Applications - Automotive
Applications - Automotive
INDUSTRY SEGMENTS
(according to CRM classifications)
APPLICATION AREAS APPLICATION
Plastic Manufacturers Thin Material Small Tubes
Steel Manufacturers
Semiconductor
Manufacturers
Automotive
General
Manufacturing
Medical
Energy
Aerospace
Multilayer Plastic &
Materials
Coil, Tubing, Plates
Multilayer Coatings Thin Coatings
Velocity
Measurements
Applications – General Manufacturing
INDUSTRY SEGMENTS
(according to CRM classifications)
APPLICATION AREAS APPLICATION
Packaging
Manufacturers Thin-walled Tubing Catheters
Catheter Manufacturers
Medical Research
Medical Equipment
Manufacturers
General
Manufacturing
Medical
Energy
Aerospace
Automotive
Packaging Thin Coatings
Multilayer Coatings Multilayer Plastic
High Frequency
Medical Research
Velocity
Measurements
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NAMICON - New Advances in Development of NDT Technologies and Equipment - Octav Teodorescu, Victor Coman, Radu Nedelcu.pdf

  • 1. Progrese Noi in Dezvoltarea Tehnologiilor si Echipamentelor de Examinari Nedistructive New Advances in Development of NDT Technologies and Equipment
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  • 4. Power You Can Carry OmniScan™ X3 64 Phased Array and TFM Flaw Detector
  • 5. Internal Positioning Cost to Customer Features / Benefits SX PA 16:64PR 1 PA group SX UT 1 UT channel X3 16:64PR 2 PA/TFM groups 1 TOFD TFM 32 el. X3 16:128PR 8 groups 2 TOFD TFM 32 el. X3 32:128PR 8 groups 2 TOFD TFM 64 el. Page 5 X3 64 (64:128PR) 8 groups 2 TOFD TFM 128 el. OmniScan X3 Series
  • 6. Power You Can Carry OmniScan™ X3 64 Phased Array and TFM Flaw Detector
  • 7. 7 Better Agility and Mobility on the Job Site Smaller and less cumbersome than other 64-channel devices, the true portability of this unit provides increased convenience to the user and flexibility for jobs where space is limited.
  • 8. 8 More Powerful Performance in a Rugged, Easy-to-Transport Unit Twice the number of pulsers contained in the same reliable OmniScan X3 box. 64 Pulsers Up to 128 TFM Elements
  • 9. 9 Minimize the Learning Curve and Save Time by Reusing your Setups This OmniScan has the same the user- friendly interface and streamlined, intuitive menu structure of the OmniScan X3 flaw detector. Compatible with OmniScan data files, it can load setup parameters from other OmniScan X3 models, so users can preserve their established settings.
  • 10. 10 Accomplish More in Less Time The OmniScan X3 64 internal storage holds larger amounts of inspection data up to 1 TB), enabling you to perform bigger scanning jobs and stay on site longer without needing to transfer your files. 1 TB Memory
  • 11. 11 Feel Supported, Wherever You Go Offering proven reliability, the OmniScan X3 64 unit is built tough to withstand harsh environments and challenging inspection demands. Backed by our global customer support, geolocation, and wireless connectivity, you can maintain high productivity and work efficiency while in the field.
  • 12. 12 ü IP65 certified rain and dust proof ü Tested in accordance with MIL-STD-810G for shocks, vibrations, thermal shocks, and drops ü User-replaceable cooling fan ü Onboard GPS* ü Software updates via the Olympus Scientific Cloud™ (OSC) *GPS not available in all regions. Contact your local Olympus representative for more details. Work More Efficiently and Confidently The unique enclosure of the OmniScan X3 series is backed up by powerful certifications and specifications:
  • 13. 13 Maximize Your Productivity Facilitate complex and specialized inspection procedures, such as new-fabrication welds in pressure vessels, using Olympus’ WeldSight™ software in tandem with the OmniScan X3 64 unit. Installing the WeldSight Remote Connect app on the flaw detector enables you to control the acquisition and instantly view your phased array (PA) data on a PC. Increase your productivity by exploiting the customizable user interface and advanced analysis tools and optimizing your equipment configuration to match your needs.
  • 14. 14 Thoroughly Examine Thicker Welds and Coarse-Grained Materials Improved phased array focusing capabilities supported by the larger active aperture enables imaging deeper into thick welds and thick- walled material.
  • 15. 15 Expand Your PA and TFM Capabilities Increase your potential to meet the challenges of your customers and develop new procedures for a wider range of applications. Gain the power to drive advanced PA probes such as our Dual Linear Array™ or Dual Matrix Array™ probes or customized probes to achieve higher-quality imaging of acoustically challenging materials.
  • 16. 16 Enhance the Probability of Detection for Oddly Oriented Flaws 3 beam skews: 0° (nominal), −15°, and +15° Optimize your detection strategy using a Dual Matrix Array weld inspection configuration and incorporating off-axis beam skew groups onboard the OmniScan X3 64 unit. Viewing multiple beam skews simultaneously increases the likelihood of detecting oddly oriented or misoriented critical flaws without having to perform more scanning passes.
  • 17. 17 Total Focusing Method (TFM) Made Accessible The improved speed and efficiency of the OmniScan X3 64 model’s TFM makes it more feasible to incorporate as a regular part of your inspection process. The Acoustic Influence Map (AIM) tool provides you with an instant visual model of the sensitivity based on your TFM wave set (or mode), settings, and simulated reflector.
  • 18. 18 Perform Faster TFM Using a full 64-element aperture increases the acquisition speed of TFM, which is further optimized by the system’s sparse firing algorithm. Offering exponentially faster acquisition rates, our improved TFM provides you with a significant acquisition speed increase compared to our 32- channel OmniScan X3 model. Up to 4x Faster Using 64- Element Probes Up to 2x Faster With a 32- Element Aperture
  • 19. 19 Reach Your Peak Potential 128-element aperture capable, the OmniScan X3 64 unit’s TFM can be used for specialized applications. Use the clear, crisp imaging provided by 64-channel TFM to achieve more precise sizing and flaw positioning. Expand your potential to meet increasingly demanding inspection requirements.
  • 20. 20 Ease Challenging Applications Detect and distinguish smaller defects, using the high-quality imaging supported by the instrument’s 64- channel capacity. Using larger, more powerful PA probes, you can attain a better resolution deeper in the part and clearly see minute flaws such as high-temperature hydrogen attack (HTHA) before they attain the critical phase.
  • 21. 21 Achieve Precision in Fiberglass and Composites Offering lower pulse voltage limit options, the OmniScan X3 64 flaw detector enables you to eliminate front wall echo saturation and see complete echo waveforms. Use this capability to exploit all detection options, including the peak and edge, making your analysis more reliable.
  • 22. 22 Improved Performance in Attenuative Materials The OmniScan X3 64 flaw detector offers better signal penetration in materials with high sound attenuation. Its 1000 ns pulse width frequency capacity (true 0.5 MHz pulse) and 0.2 MHz lower bandwidth enables you to use lower frequency probes, improving your ability to scan the entire volume of highly attenuative materials, such as fiberglass and other composites. OmniScan X3 flaw detector OmniScan X3 64 flaw detector
  • 23. 23 OmniScan™ X3 Phased Array Flaw Detector with Innovative TFM Confidence You Can See • The OmniScan X3 flaw detector is a complete phased array toolbox. Powerful tools, including total focusing method (TFM) imaging and advanced visualization capabilities, backed by its high image quality enable you to complete your inspection with greater confidence.
  • 24. 24 Innovative and Efficient TFM – AIM Acoustic Influence Map AIM - Confirm Your TFM Beam Coverage in Advance • The Acoustic Influence Map (AIM) tool provides you with an instant visual model of the sensitivity based on your TFM mode, probe, settings, and simulated reflector. • The AIM tool takes the guesswork out of creating your scan plan—visualize the effect of a wave set (TFM mode), see where sensitivity stops, and adjust your scan plan accordingly.
  • 25. 25 OmniScan™ X3 Phased Array Flaw Detector with Innovative TFM Up to Four TFM Modes Facilitate Flaw Interpretation and Sizing • Using different TFM modes (wave sets) in the same inspection increases your chances to detect irregularly oriented indications. The OmniScan X3 flaw detector provides up to four simultaneous TFM modes to generate images from different angles. The response and characteristics from each mode - such as the tip diffraction, corner trap, and defect profile - can be used simultaneously to confirm the flaw type and improve the sizing capabilities.
  • 26. 26 OmniScan™ X3 64 - Benefit from 64-Pulser Phased Array Exploit the full potential of 64-element phased array probes using the OmniScan X3 64 flaw detector to achieve improved resolution at the focal point. • Slide 1: Acquired using a 32-channel OmniScan X3 unit with a 64-element probe (5L64-A32 model), this S-scan is a high-quality image but the resolution reflects the fact that only the middle 32 elements could be used for the focal law.
  • 27. 27 OmniScan™ X3 64 - Benefit from 64-Pulser Phased Array Exploit the full potential of 64-element phased array probes using the OmniScan X3 64 flaw detector to achieve improved resolution at the focal point. • Slide 2: Using a full 64-element aperture (5L64-A32 probe), the OmniScan X3 64 flaw detector provides better PA resolution at the focal point, enabling you to more easily distinguish indications that are close together or in a cluster.
  • 28. 28 OmniScan™ X3 64 - Benefit from Full 128-Element Aperture TFM Access Full 128-Element Aperture TFM • Made possible by new generation electronics, TFM imaging offers better focusing capabilities for smaller indications and an improved signal-to-noise ratio (SNR). With its 128-element aperture capacity, the OmniScan X3 64 model provides enhanced image clarity. • Slide 1: This TFM image was acquired with 64 elements of a 128-element probe (3.5L128-I4 model) using an OmniScan X3 32-channel model.
  • 29. 29 Access Full 128-Element Aperture TFM • Made possible by new generation electronics, TFM imaging offers better focusing capabilities for smaller indications and an improved signal-to-noise ratio (SNR). With its 128-element aperture capacity, the OmniScan X3 64 model provides enhanced image clarity. • Slide 2: Here, the OmniScan X3 64 flaw detector enabled us to use the full 128- element aperture of our 3.5 MHz, 128- element I4 probe. Note the improved resolution and reduced background noise. OmniScan™ X3 64 - Benefit from Full 128-Element Aperture TFM
  • 31. 31 OmniScan X3 Series OmniScan X3 models 16:64PR, 16:128PR, or 32:128PR OmniScan X3 64 model 64:128PR
  • 32. 32 Specifications OmniScan X3 (ref. 32:128PR) OmniScan X3 64 64:128PR Weight, Size, Enclosure, MXU Software, Certifications, Receiver Channels, and Group Quantity Identical Pulsers 32 64 TFM Maximum Aperture 64 (Extended Aperture) 128 (Extended Aperture) Input Bandwidth 0.5 MHz to 18 MHz 0.2 MHz to 26.5 MHz Maximum Pulse Width 500 ns 1000 ns (true 0.5 MHz) Pulse Voltages (PA) 40 V, 80 V, 115 V Unipolar Negative Square Pulse 5 V, 10 V, 20 V, 40 V, 60 V, and 80 V Bipolar Square Pulse Internal SSD Storage Capacity 64 GB 1 TB Specification Comparison OmniScan X3 Series
  • 33. 33 Unipolar Negative versus Bipolar Square Pulse OmniScan X3 64 Pulse Voltage Explained OmniScan X3 model OmniScan X3 64 model −115 V Maximum Unipolar Pulse Voltage (no load) −80 V Maximum +80 V Maximum Total Bipolar Pulse Voltage (no load) = 160 V Resulting effective voltage on transducer is similar. 115 V Unipolar ≈ 80 V Bipolar
  • 34. 34 OmniScan X3 64 Pulse Width Explained OmniScan X3 model OmniScan X3 64 model Maximum Pulse Width: 500 ns 1 MHz Pulse 0.5 MHz Pulse Maximum Pulse Width (Half of Bipolar Pulse): 1000 ns
  • 35. 35 OmniScan X3 display at minimum gain and minimum pulse voltage (40 V) OmniScan X3 64 display at minimum gain and minimum pulse voltage (5 V) Effect of Lower Pulse Voltage Limit The OmniScan X3 64 flaw detector enables pulse voltages as low as 5 V (bipolar). This effectively prevents front wall saturation and achieves increased precision on time-of-flight measurements.
  • 36. 36 OmniScan X3 with 5L64-A32 using only the middle 32 elements. OmniScan X3 64 with the same 5L64-A32 probe and configuration but using all 64 elements. Effect of 64 Pulsers in Phased Array The OmniScan X3 64 increased pulser count allows you to fully use the aperture of 64-element probes, which has the potential to improve the resolution when focused on the defect location.
  • 37. 37 Effect of Larger Dual Probe on Thick Austenitic Weld 2.25DL32-A26 (2x 32 elements, 1 mm pitch). 2.25DL64-A(26) (2x 64 elements, 1 mm pitch). OmniScan X3 OmniScan X3 64 The OmniScan X3 64 increased pulser count supports larger Dual Linear and Dual Matrix Array probes which can significantly improve resolution and sensitivity at great depths.
  • 38. 38 OmniScan X3 model using only the middle 64 elements (using aperture control) of a 3.5L128-I4 probe. OmniScan X3 64 model with the same 3.5L128-I4 probe and configuration, using all 128 elements. Effect of 128 Elements in Total Focusing Method (TFM) Imaging The OmniScan X3 64 flaw detector enables you to use a full 128-element aperture of 128-element probes, which can significantly improve the resolution and increase the beam coverage.
  • 40. 40 Phased Array and Ultrasonic Testing Data Analysis PC Software OmniPC™ analysis software is the computer-based companion software for OmniScan X3 series flaw detectors. An inspection tool created by inspectors, OmniPC software provides the power and performance to handle all your basic data analysis and reporting needs. OmniPC™ 5 Software
  • 41. 41 Complimentary Companion Software for OmniScan Flaw Detectors OmniPC 5 software is free for download, including updates. OmniPC 5 is compatible with OmniScan MX2 and OmniScan SX data files (.opd) so you can compare inspection results over time. • No HASP key! • No product key! • No renewal payments! OmniPC running multiple program instances on multiple monitors
  • 42. 42 Optional Advanced Analysis Software for OmniScan X3 Series Data WeldSight™ software’s comprehensive acquisition and analysis tools enable you to engineer compliant and repeatable advanced phased array (PA), ultrasonic testing (UT), and time-of-flight diffraction (TOFD) weld inspections. Pushing flaw characterization and sizing further, WeldSight software’s tools enable inspectors to conduct thorough analyses that comply with strict validation requirements of international or internal standards. ü Complete code-compliant phased array ultrasonic testing ü Customizable data displays ü Easy data merging and file stitching ü Optimized workflows for rapid analysis ü Advanced, customizable reporting
  • 43. 43 Keep Pace with Production With the WeldSight Remote Connect app, data files acquired on the OmniScan™ X3 series units are transferred instantly to the WeldSight computer or laptop. The battery-operated unit enables greater setup configuration flexibility and increased portability. The optional protection door helps keep out dust and water splashes while the OmniScan X3 series flaw detector is controlled via WeldSight software. WeldSight software performs live PAUT data acquisition with any OmniScan X3 model
  • 44. 44 Optional Special-Purpose Door for OmniScan X3 Series Protect the connectors using the optional door that remains closed while the unit is connected to the WeldSight computer. Installing the new OmniScan X3 special purpose door is a snap!
  • 45. 45 OmniScan X3 64 Launch Promotion For a limited time, Olympus offers the OmniScan X3 64 flaw detector in combination with the WeldSight software Inspection license and ES BeamTool. This combination of high-end products offers both live data acquisition and advanced analysis in a portable package. Ask Your Olympus Representative!
  • 47. 47 Q. What does the name “OmniScan X3 series” signify? A: With the launch of the OmniScan X3 64 flaw detector, we introduced the product family name “OmniScan X3 series,” which encompasses all available OmniScan X3 models. We chose the term “series” as most specifications or capabilities are similar for all models. There are currently three OmniScan X3 models (16:64PR, 16:128PR, and 32:128PR) and one OmniScan X3 64 model (64:128PR). Q. Does new OmniScan X3 64 flaw detector offer all functionalities and perform all the applications that the other OmniScan X3 models can? A: Yes! Actually, in many cases, it offers either enhanced performance or expanded capabilities. Q. Do my OmniScan X3 accessories, adaptors, and scanners also work on the new OmniScan X3 64 unit? A: Absolutely! General
  • 48. 48 Q. Will the batteries that I use in previous OmniScan models also work in the new OmniScan X3 64 unit? A: Yes, as we use the same battery model for all flaw detectors in the OmniScan family. Q. Why is only one battery shipped with OmniScan purchases? A: We would like to keep including the second battery; however, many international carriers do not accept a second battery and certain countries also have specific import regulations prohibiting it, which makes it impossible to offer the second battery as a standard inclusion. Unfortunately for these reasons, the second battery must be purchased separately. Q. What is the battery life with the new OmniScan X3 64 flaw detector? A: Similar to the other OmniScan X3 models: 5 hours of continuous operation with 2 fully charged batteries installed. Batteries
  • 49. 49 Q. Does the OmniScan X3 MXU onboard software also work on the new OmniScan X3 64 model? A: Yes! The same software runs on both OmniScan X3 models. Q. Can I reuse my MX2 and SX setup and data files with the new OmniScan X3 64 flaw detector? A: You can, just like you can with any other OmniScan X3 model. Setup files will load directly on OmniScan X3 series instruments and data files will load using OmniPC 5 software. Q. Can I use a file I created on another OmniScan X3 model (32:128PR, for example) and load it on the new OmniScan X3 64 flaw detector? A: Definitely! You can also do the opposite (create a file on OmniScan X3 64 unit and load it in another OmniScan X3 model). Please keep in mind that data may need to be adapted to the instrument’s capabilities - for example, a setup file using 64 pulsers will be adjusted to 32 pulsers if loaded on a 32- pulser instrument. Compatibility
  • 50. 50 Q. Can the new OmniScan X3 64 unit be remotely operated using WeldSight software? A: Yes! The objective of our launch promotion is specifically to encourage users to optimize that capability. WeldSight software supports any model of the OmniScan X3 series when using the Inspection license (preferably with ES BeamTool) along with the WeldSight Remote Connect app, which is available for download for free on the Olympus IMS website. Q. The new OmniScan X3 64 unit’s maximum pulse voltage is 80 V, while the other OmniScan X3 models have a 115 V maximum. Why is the new OmniScan X3 64 flaw detector offering a lower maximum voltage? A: In reality, it’s not lower. The OmniScan X3 64 unit features a bipolar pulse, which is when a negative voltage pulse is followed by an equally strong positive voltage pulse. Both the negative and positive pulses combine to form a maximum 160 V peak-to-peak voltage. When the OmniScan X3 64 unit pulses at 80 V, it sends 160 V to the probe. In practice, after the energy is transferred to the probe, the resulting sound pressure from the OmniScan X3 64 unit’s 80 V bipolar pulse is in fact very similar to the resulting sound pressure generated by the other OmniScan X3 models’ 115 V negative only pulse. Advanced Topics
  • 51. 51 Q. Can I upgrade my current OmniScan X3 model to an OmniScan X3 64 model? A: Unfortunately, no. Although there are many shared components between the new OmniScan X3 64 unit and other OmniScan X3 models, the electronics that power them are different, and upgrading is not possible. However, please discuss trade-in options with your local Olympus representative if you’re interested. Q. Can I update the onboard MXU software on the new OmniScan X3 64 flaw detector? A: Yes! The procedure is the same with all OmniScan X3 series instruments. Please go to https://www.olympus-ims.com/en/service-and-support/downloads/, download the latest MXU software, and follow the on-screen instructions. Or, better yet, equip your OmniScan X3 64 flaw detector with a compatible wireless LAN dongle (consult the User’s Manual for details) and get software updates directly via the OmniScan Launcher. Upgrades and Updates
  • 52. 52 Learn more about the OmniScan X3 64 flaw detector and download the training package: https://www.olympus- ims.com/en/phasedarray/omniscan-x3/ Learn more about WeldSight software: https://www.olympus- ims.com/en/weldsight/ Download the latest MXU onboard software for the OmniScan X3 series, OmniPC 5 software, WeldSight software, or the WeldSight Remote Connect app: https://www.olympus- ims.com/en/service-and- support/downloads/ Online Resources
  • 53. 53 OmniScan X3 64 - Launch Promotion For a limited time, Olympus offers the OmniScan X3 64 flaw detector in combination with the WeldSight software Inspection license and ES BeamTool. This combination of high-end products offers both live data acquisition and advanced analysis in a portable package. Ask Your Olympus Representative!
  • 54. 54 OmniScan™ X3 Series – Up-grade & Trade-in Up-grade up to OmniScan X3 32:128PR Trade-in from any MX / MX2 / X3 to OmniScan X3 64
  • 56. 72DL PLUS - Precision Thickness Gauges
  • 57. Internal Product Position 27MG 45MG 38DL PLUS 72DL PLUS - Standard 72DL PLUS - HF Multilayer Measurement S/W
  • 58. Product Position 72DL PLUS Standard Frequency à - Offers largest display - Touchscreen - Much faster update rate (up to 2KHz) - Transducer frequency from 0.2 MHz to 30 MHz 72DL PLUS High Frequency à - Transducer frequency from 0.2 MHz to 125 MHz - Thickness measurement capability far below the existing 38DL PLUS Multilayer Measurement S/W à - Measure up to 6 layers simultaneously Internal Product Position 27MG 45MG 38DL PLUS 72DL PLUS - Standard 72DL PLUS - HF Multilayer Measurement S/W
  • 59. High Frequency: Up to 125MHz High Speed: Up to 2000Hz PRF(Single Shot), 60Hz Display Powerful Multilayer: Up to 6 individual layers New Thickness Lows: Measure down to 12µm (plastic) High Resolution: Up to 0.25µm Lab Quality Measurements for the Production Floor Overview
  • 61. Key Features PC Interface Application: for plant integration of workflow, inspection management, alerts, and data analysis. Efficient Data Management: Internal data logging and PC Interface to speed up data collection and review Connected: supports wireless LAN and Bluetooth® Cloud Enabled: wireless connection to the Olympus Scientific Cloud™ (OSC) and compatible OSC apps Rugged: Designed for IP65 Large, Clear Screen: 7” high resolution touchscreen WVGA display New and Improved Measurement Algorithm: Single shot measurements up to 2KHz Powerful Multilayer Software: Measure up to 6 individual layers simultaneously New Thickness Lows: Measure down to 20µm (metal), 12.7µm (plastic) Easy Application Setup: create custom applications to reduce device setup time for routine inspections
  • 62. New and Improved Measurement Algorithms Single shot measurements Measurement Rate up to 2KHz Reliable measurement results at high speed Calibration, Gain, and Blank control on frozen waveforms Multilayer thickness measurement of up to 6 layers Versatile data presentations (A- scan, B-scan, A/B-scan, Trend, Zoom, Custom) to suit application/user needs
  • 63. Versatile data presentations to suit application/user needs A-Scan B-Scan A/B-Scan Zoom Trend
  • 64. Intuitive User Interface Improved wave adjust menu Intuitive workflow, allowing easy set up to cover diverse and complex applications User application files for fast configuration recall Inspection Data Files map the thickness measurement locations on the part to the ID numbers (“Part Map”) Instrument locks
  • 65. Designed for Manufacturing Environment & Portable Apps Faster inspection with go/no-go alarms 7” high-resolution WVGA touchscreen display with wide- viewing angle Engineered to IP65 and drop tested (MIL-STD-810G)
  • 66. PC Interface Application Create, Manage, Share, and Analyze Data Data Trending Dashboard Build customized part maps with clear inspection point Bi-directional file transfer to and from the gauge Report Generation with customized templates
  • 67. Wireless Connectivity to OSC User account creation and administrative level management Register device(s) Retrieve Calibration Certificate(s) Monitor Device Health Information Firmware Updates
  • 68. Not just a product, but a complete solution • On board part creation • Part inspection • Review inspection data files 72DL PLUS • Create custom part • Bidirectional transfer to multiple gauges • Data trending dashboard • Data Analysis • Generate custom reports Interface Application • User Account Creation • Register Device • Retrieve Calibration Certificate(s) • Monitor Device Health Information • Firmware Updates Cloud Connection A Complete Workflow Solution
  • 70. Product Appearance | Front Adjustment Knob Easy parameter adjustments Simple Button Design Efficient navigation Touchscreen Display 7” high-resolution WVGA display with wide viewing angle
  • 71. Product Appearance | Top Lemo Connector Standard Frequency Transducers BNC Connector High Frequency Transducers 19 Pin Accessory Connector Foot Switch and external alarms DC Power Connector Mounting Points Chest Strap/ Shoulder Strap
  • 72. Product Appearance | Right Data Port Release Latch Easy slide to open cover Mounting Points Chest Strap/ Shoulder Strap Micro HDMI Connector External Display USB A Connector USB Storage, Bluetooth Mouse Mini USB B Connector PC for Data Transfer
  • 73. Product Appearance | Back Thumb Screws To Open Battery Compartment Cover Pipe Stand Mounting Points
  • 75. High Frequency Contact Transducers • NEW High Frequency Transducers • M2104 – 125MHz • M2102 – 75 MHz • Built with three ceramic discs on front plate to prevent wear from contact applications • Minimal mechanical delay for improved thickness ranges • Probe Bubbler Assembly • B126 – Used with M2100 series transducers • Existing High Frequency Transducers (recommended) • V215-BA-RM – 50 MHz (0.8 inch case diameter) • V215-BB-RM – 50 MHz (0.4 inch case diameter) High Frequency Contact Applications
  • 76. Applications • Measurements at 50 MHz • Multilayer paint (125 MHz) • Components • Multilayer plastics • Windshields Energy General Manufacturing All Other Industries Aerospace Automotive • Turbine blades • Paint/ Coatings on composites • Multilayer aircraft window • Thin material • Single & multilayer coatings • Multilayer plastics and materials • Raw Materials (Coil, Tubing, Plates) • Medical (Thin-walled tubing, packaging) • Contact Lenses
  • 77. INDUSTRY SEGMENTS (according to CRM classifications) APPLICATION AREAS APPLICATION Aerospace Manufacturers Turbine Blade Radome Turbine Blade Manufacturers Repair and Maintenance Energy Aerospace Automotive General Manufacturing Medical Multilayer Aircraft Window Multilayer Paint on Composites Multilayer Plastics Thin Coatings Velocity Measurements Applications - Aerospace
  • 79. INDUSTRY SEGMENTS (according to CRM classifications) APPLICATION AREAS APPLICATION Automotive Manufacturers Multilayer Paint on Metal Multilayer Paint on Plastics Automotive Suppliers Fuel Tank Manufacturers Aerospace Automotive General Manufacturing Medical Energy Multilayer Plastic Fuel Tanks Multilayer Windshields Multilayer Coatings Thin Coatings Velocity Measurements Applications - Automotive
  • 81. INDUSTRY SEGMENTS (according to CRM classifications) APPLICATION AREAS APPLICATION Plastic Manufacturers Thin Material Small Tubes Steel Manufacturers Semiconductor Manufacturers Automotive General Manufacturing Medical Energy Aerospace Multilayer Plastic & Materials Coil, Tubing, Plates Multilayer Coatings Thin Coatings Velocity Measurements Applications – General Manufacturing
  • 82. INDUSTRY SEGMENTS (according to CRM classifications) APPLICATION AREAS APPLICATION Packaging Manufacturers Thin-walled Tubing Catheters Catheter Manufacturers Medical Research Medical Equipment Manufacturers General Manufacturing Medical Energy Aerospace Automotive Packaging Thin Coatings Multilayer Coatings Multilayer Plastic High Frequency Medical Research Velocity Measurements Applications - Medical
  • 84. INDUSTRY SEGMENTS (according to CRM classifications) APPLICATION AREAS APPLICATION Inspection Service Providers Asset Owners Medical Energy Aerospace Automotive General Manufacturing Thin Materials Thin Coatings Multilayer Coatings Velocity Measurements Applications - Energy
  • 86. Standard Frequency Configurations High Frequency Configurations Offerings Transducer not included with any model!