Raptor Series MOSFET & Discrete Test System

1. Low cost New technology High performance
Cogent ATE ™
D 100
Raptor Series™ Discrete Test System
Cogent ATE’s Raptor Series Discrete Test System represents a transformational change in
the testing of discrete semiconductor devices. D-100 is the first tester in its class to
perform parallel multi-site testing of up to 4 devices in both wafer and final test.
Cogent ATE’s Raptor Series D-100 Discrete Test System provides Floating Quad-Site
Testing™ of MOSFET devices in both wafer and packages. Using Cogent ATE’s proven
Floating Test Sites™ (FTS) System Architecture, D-100 provides the most practical and
cost-effective test solution for its target devices. DSP, AWG, Memory and other ATE
features based Cogent ATE’s Tester-on-a-chip™ (ToC) technology, unseen in traditional
discrete test systems; give D-100 an edge in accuracy and throughputs. Raptor Series
D-100 is only a fraction of ETS-200T in cost.
Floating Quad-Site Testing™ is Real and Guaranteed
Target Devices True parallel testing of up to 4 device-under-test (DUT) sites is not only real but also
affordable with Cogent ATE’s Leopard Series Analog and Mixed-Signal Test System. For
Power MOSFET our targeted device markets, quad-sites parallel testing is most economical and practical
Diodes, Zener diodes solution for both wafer and final tests. Turret based handlers, a popular choice for
Transistors discrete and power management devices are capable of quad-site testing. “Massive Parallel
Thyristors wafer testing is often unrealistic given the cost and technical issues in the interface
Triacs, Varistors, technology, i.e. probe card.
Multi die / function discretes
We have achieved the lowest cost-of-test to date for the Discrete Power Semiconductor
Voltage regulators
and Power Management IC markets by making Floating Quad-Site Testing™ a compelling
alternative to the non-floating single or dual site testers from our competitions. We intend
to maintain this leadership by continuously improving test performance and lowering
hardware cost.

2. Cogent ATE Series
Raptor
Low-Cost MOSFET and Discrete test platform
Summary
Features
Designed for multi-site testing
Prior to the introduction of Raptor D series, ETS-200T, a tester designed for
True parallel multi-site testing
multi-site testing of MOSFET devices, is perhaps the only option. Now Raptor D
with Floating Quad-Site Testing
Series is a new option for multi-site testing at a fraction of ETS-200’s cost. While
architecture
ETS-200 can test up to 16 sites, the cost of the tester and the probe card make 16
Scale from Single to Multi-Site sites testing unrealistic and unaffordable. Cogent ATE’s Raptor D series has
Testing automatically with Auto dramatically reduced the test cost by reducing both testing and tester cost at the same
Test Replication time.
SBC Industrial PC, Telescope
mounting for Monitor and
Keyboard on the manipulator
for a compact and ergonomic
test cell
Fix for multi-handler/prober
Now the situation is many customers use the turret-based handlers, such as Ismeca,
SRM . which often have quad-site testing capability. Cogent ATE’s Raptor Series
Discrete Test System can maximize these equipment’s throughputs without buy new
equipments.
Cogent ATE’s Raptor Series D-100 Discrete Test System can test a wide range of
device from small signal transistors to high power IGBT. A suitable model for your
product may be chosen from below.
D‐50© D‐100© D‐120© D‐200© D220© D‐520©
Test System
Current 10A 30A 30A 200A 200A 500A
Voltage 1,000V 1,000V 2,000V 1,000V 2,000V 2,000V
page 2 Cogent ATE Systems Corporation | Room 705, No.8 Dongdaqiao Road,Chaoyang District,Beijing,China | Tel: +86(10)59000102 | Fax:+86(10)58850677 | www.CogentATE.com

3. Cogent ATE Series
Raptor
Friendly Software for both IC design and Production environment
Raptor D series test system software
Easy ATE™ has several industry-first
features that are very useful for the
debug and characterization of power
ICs. In most ATEs a simple voltage
force and current sense scenario may
damage the ATE if the sensed current
is large. Some ATEs try to dissipate the
sense current with large heat sink.
Cogent ATE’s patented technology
allows the Power IC designer to
observe a static sense a current as large
as 2 Amp and 50 Volt.
Specifications
Current Voltage
Measure Range Measure Range
Resolution Resolution
F.S. F.S
20uA 610pA 20mV 0.61uV
200uA 6.1nA 200mV 6.1uV
2mA 61nA 2V 61uV
20mA 610nA 5V 153uV
200mA 6.1uA 10V 305uV
2A 61uA 20V 610uV
10A 305uA 100V 3.05mV
40A 1.22mA 1000V 15mV
General accuracy: 0.1% of Range to 0.5% + 10 pA/V General accuracy: 0.1% of Range to 0.5% of Range
Power Requirements Operational Dimensions
Width inches (cm) Depth inches (cm) Height inches (cm)
AC single phase, 110 V, 6 A OR 220 V, 3 A 26(66) 24.5(62) 44.5(108)
Cogent ATE Systems Corporation
Room 705,SOHO Shangdu North Tower B
No.8 Dongdaqiao Road,Chaoyang District
Beijing 100020, P.R.China
Tel: +86(10)59000102 | Fax: +86(10)58850677
World Wide Web | www.CogentATE.com
Cogent ATE is a registered trademark; the Cogent ATE logo and Leopard Series are trademarks of Cogent ATE Systems Corporation.
All other trademarks are the property of their respective owners.
© 2008 Cogent ATE Systems Corporation. All rights reserved.