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ADVANCED MATERIALS ANALYSIS EDX WDX TXRF PIXE
- 2. INTRODUCTION X-ray Fluorescence (XRF)
- 8. Energy-dispersive spectrometers
- 10. Detector and cryostat
- 24. Interaction between MeV ions and a material surface.Processes relevant to ion beam analysis
- 30. Typical PIXE spectrum of normal and varicose veins with 175mm Maylar absorber in front of Si(Li) detector