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SCANNING ELECTRON MICROSCOPE
BY
GAJENDRA KUMAR
ID- 2011uit1721
WHAT IS SEM
 It is a microscope that uses a focused electron probe
to extract structural and chemical information point-
by-point from a region of interest in the sample.
WHAT IS SEM
 SEM is a powerful magnification tool .The
high-resolution, three-dimensional images
produced by SEMs provide topographical,
morphological and compositional
information makes them invaluable in a
variety of science and industry applications.
PRINCIPLE
SEM DIAGRAM
Components of sem
• electron gun (filament)
• Electron beam generation.
• electromagnetic optics
• Controlling diameter of e beam.
• scan coils
• Gives parralel e beam.
• sample stage
• Hold sample
• detectors
• Detects electronic signals
• vacuum system
• computer hardware
Electromagnetic lens
 A coil of wire through which current flows. Because
the current flow produces a magnetic field at right
angles, the field pushes inwards into the hole in the
centre.This acts to shape a beam of electrons
travelling in their natural spiral path down the
central hole.
 The condenser lens is at the top and the objective
lens at the bottom. Each does a different job.The
condenser lens converges the cone of the electron
beam to a spot below it, before the cone flares out
again and is converged back again by the objective
lens and down onto the sample.
Interaction of Electron with sample
 Elastic interactions-
No electron collision so no energy loss.
 Inelastic interactions
Collision of electrons and energy loss.
Interaction of Electron with sample
E collision scattering Auger effect
SEM SIGNALS
Detectors
 Secondary electrons: Everhart-Thornley
Detector
 Backscattered electrons: Solid State
Detector
 X-rays: Energy dispersive spectrometer
(EDS)
SEM WORKING
 http://www.youtube.com/watch?v=bfSp8r-
YRw0
APPLICATIONS
 Topography and morphology
 Chemistry
 Crystallography
 Orientation of grains
 In-situ experiments:
 Reactions with atmosphere
 Effects of temperature
Topography and morphology
Chemistry
Fe Ce
Sr
In-situ imaging
 oxidation of steel at high temperatures
800 °C, pH2O = 667 Pa
Formation of Cr2O3
2 min 10 min 90 min
Results
SEM Results: 30 nm crystalline
 g
Eleme
nt
Weight
%
Atomic
%
Ti 45.08 50.15
Ni 54.92 49.85
Totals 100.00
 The compositions are of 50.15 at.% Ti–
49.85 at.% Ni.
A few particles of different sizes have been
observed in this sample.
Limitations
 Big samples
 Liquid samples
 Insulators (Usage after experiment)
 Very high vacuum
 Vibration free
 Large space
 Morphology Modification
Scanning electron microscope

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Scanning electron microscope

  • 2. WHAT IS SEM  It is a microscope that uses a focused electron probe to extract structural and chemical information point- by-point from a region of interest in the sample.
  • 3. WHAT IS SEM  SEM is a powerful magnification tool .The high-resolution, three-dimensional images produced by SEMs provide topographical, morphological and compositional information makes them invaluable in a variety of science and industry applications.
  • 6. Components of sem • electron gun (filament) • Electron beam generation. • electromagnetic optics • Controlling diameter of e beam. • scan coils • Gives parralel e beam. • sample stage • Hold sample • detectors • Detects electronic signals • vacuum system • computer hardware
  • 7. Electromagnetic lens  A coil of wire through which current flows. Because the current flow produces a magnetic field at right angles, the field pushes inwards into the hole in the centre.This acts to shape a beam of electrons travelling in their natural spiral path down the central hole.  The condenser lens is at the top and the objective lens at the bottom. Each does a different job.The condenser lens converges the cone of the electron beam to a spot below it, before the cone flares out again and is converged back again by the objective lens and down onto the sample.
  • 8.
  • 9. Interaction of Electron with sample  Elastic interactions- No electron collision so no energy loss.  Inelastic interactions Collision of electrons and energy loss.
  • 10. Interaction of Electron with sample E collision scattering Auger effect
  • 12. Detectors  Secondary electrons: Everhart-Thornley Detector  Backscattered electrons: Solid State Detector  X-rays: Energy dispersive spectrometer (EDS)
  • 14. APPLICATIONS  Topography and morphology  Chemistry  Crystallography  Orientation of grains  In-situ experiments:  Reactions with atmosphere  Effects of temperature
  • 17. In-situ imaging  oxidation of steel at high temperatures 800 °C, pH2O = 667 Pa Formation of Cr2O3 2 min 10 min 90 min
  • 19. SEM Results: 30 nm crystalline  g Eleme nt Weight % Atomic % Ti 45.08 50.15 Ni 54.92 49.85 Totals 100.00  The compositions are of 50.15 at.% Ti– 49.85 at.% Ni. A few particles of different sizes have been observed in this sample.
  • 20. Limitations  Big samples  Liquid samples  Insulators (Usage after experiment)  Very high vacuum  Vibration free  Large space  Morphology Modification